Inventor · disambiguated record
Hans-Jürgen Engelmann
Also filed as: ENGELMANN HANS-JUERGEN · ENGELMANN HANS-JURGEN
1 granted patent·1 pending application·0 citations·filing 2002–2011
9Inventor score
Files withPOTAPOV PAVEL1
Top patents by PatentIndex Score
2 records- 0129US8442357B2Method for reconstructing two-dimensional chemical maps from electron spectroscopy line scansPOTAPOV PAVEL·Filed 2011·Granted May 14, 2013·0 cites·20 claims
- 0225US2003222215A1Method for objective and accurate thickness measurement of thin films on a microscopic scaleFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →