Inventor · disambiguated record
Hans-Georg Froehlich
Also filed as: FROEHLICH HANS · FROEHLICH HANS-GEORG
4 granted patents·34 citations·filing 1992–2005
74Inventor score
Top patents by PatentIndex Score
4 records- 0167US7425396B2Method for reducing an overlay error and measurement mark for carrying out the sameINFINEON TECHNOLOGIES AG·Filed 2004·Granted Sep 16, 2008·19 cites·12 claims
- 0260US7084962B2Method for detecting positioning errors of circuit patterns during the transfer by means of a mask into layers of a substrate of a semiconductor waferINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 1, 2006·7 cites·17 claims
- 0358US7251016B2Method for correcting structure-size-dependent positioning errors in photolithographyINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 31, 2007·2 cites·40 claims
- 0420US5445544AWire end ferruleGLW ELEKTROTECH BAUTEILE·Filed 1992·Granted Aug 29, 1995·6 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →