Inventor · disambiguated record
Han Haitjema
Also filed as: HAITJEMA HAN
4 granted patents·2 pending applications·14 citations·filing 2013–2018
68Inventor score
Files withMITUTOYO CORP6
Top patents by PatentIndex Score
6 records- 0185US9568304B2Image sequence and evaluation method and system for structured illumination microscopyMITUTOYO CORP·Filed 2015·Granted Feb 14, 2017·8 cites·12 claims
- 0279US10458779B2Method and apparatus for inner diameter measurement of transparent tubeMITUTOYO CORP·Filed 2018·Granted Oct 29, 2019·3 cites·16 claims
- 0377US9103651B2Method and apparatus for determining a property of a surfaceMITUTOYO CORP·Filed 2013·Granted Aug 11, 2015·3 cites·18 claims
- 0451US2018031415A1Interferometer system having a continuously variable broadband reflector and method to generate an interference signal of a surface of a sampleMITUTOYO CORP·Filed 2017·Application pending·0 cites
- 0550US2014362383A1Interferometer system and method to generate an interference signal of a surface of a sampleMITUTOYO CORP·Filed 2014·Application pending·0 cites
- 0649US10024648B2Interference measuring device and method of measurement using the same deviceMITUTOYO CORP·Filed 2017·Granted Jul 17, 2018·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →