Inventor · disambiguated record
Hachiro Hiratsuka
Also filed as: HIRATSUKA HACHIRO
3 granted patents·96 citations·filing 1988–1993
71Inventor score
Files withTOSHIBA KK3
Top patents by PatentIndex Score
3 records- 0186US5271796AMethod and apparatus for detecting defect on semiconductor substrate surfaceTOSHIBA KK·Filed 1992·Granted Dec 21, 1993·83 cites·20 claims
- 0239US5508800ASemiconductor substrate, method of manufacturing semiconductor substrate and semiconductor device, and method of inspecting and evaluating semiconductor substrateTOSHIBA KK·Filed 1993·Granted Apr 16, 1996·11 cites·13 claims
- 0327US4837610AInsulation film for a semiconductor deviceTOSHIBA KK·Filed 1988·Granted Jun 6, 1989·2 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →