Inventor · disambiguated record
Hajime Kawano
Also filed as: KAWANO HAJIME
85 granted patents·13 pending applications·738 citations·filing 1991–2024
99Inventor score
Files withHITACHI HIGH TECH CORP70HITACHI MEDICAL CORP9HITACHI LTD4NGK SPARK PLUG CO4PANASONIC CORP3
Top patents by PatentIndex Score
98 records- 0196USD644256SAutonomous mobile robotPANASONIC CORP·Filed 2011·Granted Aug 30, 2011·104 cites·1 claims
- 0294US8334520B2Charged particle beam apparatusOTAKA TADASHI·Filed 2009·Granted Dec 18, 2012·53 cites·19 claims
- 0393US9177759B2Processing apparatus and method using a scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 3, 2015·16 cites·10 claims
- 0492US9697987B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Jul 4, 2017·9 cites·11 claims
- 0591US10720306B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 21, 2020·4 cites·12 claims
- 0691USD663333SAutonomous mobile robotKITANO YUKIHIKO·Filed 2012·Granted Jul 10, 2012·60 cites·1 claims
- 0790US10249474B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Apr 2, 2019·4 cites·10 claims
- 0889US8618499B1Electron beam irradiation apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 31, 2013·6 cites·5 claims
- 0988US9236220B2Electronic microscope, setting method of observation condition of electronic microscope, and observation method using electronic microscopeHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 12, 2016·8 cites·17 claims
- 1085US9053905B2Electron beam irradiation apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 9, 2015·4 cites·9 claims
- 1185US8890096B2Measuring/inspecting apparatus and measuring/inspecting method enabling blanking control of electron beamHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 18, 2014·8 cites·14 claims
- 1285US5633588ASuperconducting magnet apparatus using superconducting multilayer composite member, method of magnetizing the same and magnetic resonance imaging system employing the sameHITACHI MEDICAL CORP·Filed 1995·Granted May 27, 1997·50 cites·35 claims
- 1384US11062892B2Charged particle detector including a light-emitting section having lamination structure, charged particle beam device, and mass spectrometerHITACHI HIGH TECH CORP·Filed 2017·Granted Jul 13, 2021·3 cites·10 claims
- 1484US9336984B2Charged particle beam device and measuring method using the sameHITACHI HIGH TECH CORP·Filed 2014·Granted May 10, 2016·6 cites·9 claims
- 1584US6541784B1Electron beam exposure system and exposing method using an electron beamHITACHI LTD·Filed 2000·Granted Apr 1, 2003·20 cites·13 claims
- 1681US10903037B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jan 26, 2021·2 cites·13 claims
- 1780US9368324B2Measurement and inspection deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 14, 2016·4 cites·15 claims
- 1880US7778776B2Obstacle avoidance method and obstacle-avoidable mobile apparatusPANASONIC CORP·Filed 2007·Granted Aug 17, 2010·17 cites·7 claims
- 1979US11133147B2Charged particle ray device and cross-sectional shape estimation programHITACHI HIGH TECH CORP·Filed 2018·Granted Sep 28, 2021·2 cites·12 claims
- 2079US6037850ASuperconducting magnet apparatus and method of regulating magnetization thereofHITACHI MEDICAL CORP·Filed 1997·Granted Mar 14, 2000·35 cites·76 claims
- 2178US11798780B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Oct 24, 2023·0 cites·5 claims
- 2278US9978558B2Scanning-electron-microscope image processing device and scanning methodHITACHI HIGH TECH CORP·Filed 2013·Granted May 22, 2018·4 cites·5 claims
- 2378US6909798B1Method of erasing repeated patterns and pattern defect inspection deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Jun 21, 2005·33 cites·6 claims
- 2477US10818470B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Oct 27, 2020·2 cites·6 claims
- 2577US9520266B2Pattern critical dimension measurement equipment and method for measuring pattern critical dimensionHITACHI HIGH TECH CORP·Filed 2014·Granted Dec 13, 2016·4 cites·20 claims
- 2677US6781492B2Superconducting magnetic apparatusHITACHI MEDICAL CORP·Filed 2002·Granted Aug 24, 2004·18 cites·20 claims
- 2776US9543053B2Electron beam equipmentHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 10, 2017·3 cites·11 claims
- 2876US6580346B1Magnetic resonance imaging apparatusHITACHI MEDICAL CORP·Filed 1997·Granted Jun 17, 2003·34 cites·34 claims
- 2975US10546718B2High voltage power supply device and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jan 28, 2020·2 cites·10 claims
- 3075US10134558B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 20, 2018·2 cites·8 claims
- 3174US9679740B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 13, 2017·2 cites·2 claims
- 3274US2024363306A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 3373US11239052B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 1, 2022·0 cites·3 claims
- 3473US10984981B2Charged particle beam device having inspection scan direction based on scan with smaller doseHITACHI HIGH TECH CORP·Filed 2018·Granted Apr 20, 2021·1 cites·18 claims
- 3573US10593512B2Light guide, detector having light guide, and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Mar 17, 2020·1 cites·9 claims
- 3672US6674086B2Electron beam lithography system, electron beam lithography apparatus, and method of lithographyHITACHI LTD·Filed 1999·Granted Jan 6, 2004·28 cites·10 claims
- 3770US10121634B2Charged particle beam device and charged particle beam measurement methodHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 6, 2018·2 cites·14 claims
- 3870US8577498B2Automatic transfer method, transfer robot, and automatic transfer systemKAWANO HAJIME·Filed 2008·Granted Nov 5, 2013·8 cites·14 claims
- 3969US6831283B2Charged particle beam drawing apparatus and pattern forming methodHITACHI LTD·Filed 2003·Granted Dec 14, 2004·7 cites·12 claims
- 4069US6828573B1Electron beam lithography systemHITACHI LTD·Filed 1999·Granted Dec 7, 2004·24 cites·10 claims
- 4168US9644955B2Scanning electron beam device with focus adjustment based on acceleration voltage and dimension measurement method using sameHITACHI HIGH TECH CORP·Filed 2012·Granted May 9, 2017·2 cites·12 claims
- 4268US9633818B2Charged particle beam apparatus, image forming method using a charged particle beam apparatus, and image processing apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 25, 2017·1 cites·13 claims
- 4368USD663334SAutonomous mobile robotKITANO YUKIHIKO·Filed 2012·Granted Jul 10, 2012·16 cites·1 claims
- 4468US2025124566A1Defect Inspection System and Defect Inspection MethodHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 4567US10679821B1Light guide, detector having light guide, and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 9, 2020·0 cites·9 claims
- 4667US9859094B2Charged particle beam apparatus and image forming method of charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Jan 2, 2018·1 cites·10 claims
- 4767US6437672B1Superconducting magnetic deviceHITACHI MEDICAL CORP·Filed 1997·Granted Aug 20, 2002·26 cites·31 claims
- 4867US5936498ASuperconducting magnet apparatus and magnetic resonance imaging system using the sameHITACHI MEDICAL CORP·Filed 1997·Granted Aug 10, 1999·29 cites·14 claims
- 4966US9960006B2Charged-particle-beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted May 1, 2018·1 cites·14 claims
- 5066US9799483B2Charged particle beam device and detection method using said deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 24, 2017·1 cites·15 claims
Showing the top 50 of 98 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →