Inventor · disambiguated record
Hao-Ming Lien
Also filed as: LIEN HAO-MING
31 granted patents·5 pending applications·162 citations·filing 2001–2023
96Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD9TAIWAN SEMICONDUCTOR MFG8MACRONIX INT CO LTD7CHEN CHIEN HAO2LEE TZE-LIANG2
Top patents by PatentIndex Score
36 records- 0197US8895446B2Fin deformation modulationTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 25, 2014·31 cites·20 claims
- 0293US7948799B2Structure and method of sub-gate NAND memory with bandgap engineered SONOS devicesMACRONIX INT CO LTD·Filed 2008·Granted May 24, 2011·28 cites·13 claims
- 0389US8329552B1Semiconductor device and method of manufacturePENG CHIH-TANG·Filed 2011·Granted Dec 11, 2012·11 cites·20 claims
- 0488US7414889B2Structure and method of sub-gate and architectures employing bandgap engineered SONOS devicesMACRONIX INT CO LTD·Filed 2006·Granted Aug 19, 2008·15 cites·5 claims
- 0587US9276062B2Fin deformation modulationTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Mar 1, 2016·6 cites·20 claims
- 0687US9017763B2Injector for forming films respectively on a stack of wafersTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Apr 28, 2015·3 cites·5 claims
- 0787US8450161B2Method of fabricating a sealing structure for high-k metal gateCHEN CHIEN-HAO·Filed 2012·Granted May 28, 2013·9 cites·20 claims
- 0885US8735252B2Method of semiconductor integrated circuit fabricationYU WEIBO·Filed 2012·Granted May 27, 2014·9 cites·15 claims
- 0983US10269937B2Semiconductor strips with undercuts and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Apr 23, 2019·2 cites·20 claims
- 1081US9177955B2Isolation region gap fill methodTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 3, 2015·6 cites·13 claims
- 1180US8193586B2Sealing structure for high-K metal gateCHEN CHIEN-HAO·Filed 2009·Granted Jun 5, 2012·8 cites·20 claims
- 1279US9647066B2Dummy FinFET structure and method of making sameLU CHANG-SHEN·Filed 2012·Granted May 9, 2017·8 cites·20 claims
- 1379US9142402B2Uniform shallow trench isolation regions and the method of forming the sameLIOU YU-LING·Filed 2011·Granted Sep 22, 2015·6 cites·18 claims
- 1478US10170367B2Semiconductor device and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jan 1, 2019·2 cites·20 claims
- 1576US9443961B2Semiconductor strips with undercuts and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Sep 13, 2016·2 cites·20 claims
- 1669US8629508B2Semiconductor device and method of manufactureTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Jan 14, 2014·1 cites·15 claims
- 1765US7276417B2Hybrid STI stressor with selective re-oxidation annealTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Oct 2, 2007·4 cites·6 claims
- 1864US8404561B2Method for fabricating an isolation structureLEE TZE-LIANG·Filed 2010·Granted Mar 26, 2013·2 cites·20 claims
- 1963US7218554B2Method of refreshing charge-trapping non-volatile memory using band-to-band tunneling hot hole (BTBTHH) injectionMACRONIX INT CO LTD·Filed 2005·Granted May 15, 2007·6 cites·17 claims
- 2061US10316411B2Injector for forming films respectively on a stack of wafersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jun 11, 2019·0 cites·20 claims
- 2160US8163625B2Method for fabricating an isolation structureLIN YIH-ANN·Filed 2010·Granted Apr 24, 2012·1 cites·21 claims
- 2259US8828841B2Semiconductor device and method of manufactureTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Sep 9, 2014·0 cites·20 claims
- 2356US9865708B2Semiconductor strips with undercuts and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jan 9, 2018·0 cites·20 claims
- 2454US10103141B2Fin deformation modulationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Oct 16, 2018·0 cites·20 claims
- 2554US9564488B2Strained isolation regionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Feb 7, 2017·0 cites·20 claims
- 2654US8736016B2Strained isolation regionsLIANG MONG-SONG·Filed 2007·Granted May 27, 2014·1 cites·16 claims
- 2754US7307882B2Non-volatile memoryMACRONIX INT CO LTD·Filed 2005·Granted Dec 11, 2007·1 cites·5 claims
- 2853US2025089360A1Semiconductor device with bottom dielectric isolator and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2952US7852673B2Method for operating nonvolatitle memory arrayMACRONIX INT CO LTD·Filed 2009·Granted Dec 14, 2010·0 cites·14 claims
- 3048US8580653B2Method for fabricating an isolation structureLEE TZE-LIANG·Filed 2013·Granted Nov 12, 2013·0 cites·20 claims
- 3147US9779980B2Uniform shallow trench isolation regions and the method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 3, 2017·0 cites·17 claims
- 3246US2007291551A1Nonvolatitle memory array and method for operating thereofMACRONIX INT CO LTD·Filed 2006·Application pending·0 cites
- 3345US7539065B2Method of programming non-volatile memoryMACRONIX INT CO LTD·Filed 2007·Granted May 26, 2009·0 cites·14 claims
- 3443US2008138983A1Method of forming tensile stress films for NFET performance enhancementTAIWAN SEMICONDUCTOR MFG·Filed 2006·Application pending·0 cites
- 3534US2003190873A1Chemical-mechanical polishing platformFiled 2001·Application pending·0 cites
- 3633US2002182986A1Polishing pad with wear indicator for profile monitoring and controlling and method and apparatus for polishing using said padFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →