Inventor · disambiguated record
Hang Yip Liu
Also filed as: LIU HANG · LIU HANG YIP
8 granted patents·2 pending applications·33 citations·filing 2003–2022
83Inventor score
Files withINFINEON TECHNOLOGIES AG6AGENCY SCIENCE TECH & RES1LIU HANG YIP1UNITED MICROELECTRONICS CO1UNITED SEMICONDUCTOR XIAMEN CO LTD1
Top patents by PatentIndex Score
10 records- 0182US7071074B2Structure and method for placement, sizing and shaping of dummy structuresINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 4, 2006·19 cites·20 claims
- 0275US7868427B2Structure and method for placement, sizing and shaping of dummy structuresINFINEON TECHNOLOGIES AG·Filed 2009·Granted Jan 11, 2011·3 cites·21 claims
- 0370US7494930B2Structure and method for placement, sizing and shaping of dummy structuresINFINEON TECHNOLOGIES AG·Filed 2006·Granted Feb 24, 2009·2 cites·6 claims
- 0467US7052808B2Transmission mask with differential attenuation to improve ISO-dense proximityUNITED MICROELECTRONICS CO·Filed 2003·Granted May 30, 2006·8 cites·19 claims
- 0564US7807342B2Transmission mask with differential attenuation to improve ISO-dense proximityINFINEON TECHNOLOGIES AG·Filed 2005·Granted Oct 5, 2010·1 cites·6 claims
- 0656US8921166B2Structure and method for placement, sizing and shaping of dummy structuresINFINEON TECHNOLOGIES AG·Filed 2013·Granted Dec 30, 2014·0 cites·21 claims
- 0751US2011133304A1Structure and Method for Placement, Sizing and Shaping of Dummy StructuresINFINEON TECHNOLOGIES AG·Filed 2010·Application pending·0 cites
- 0849US2023402329A1Testkey structure and monitoring method with testkey structureUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2022·Application pending·0 cites
- 0946US8229062B2Transmission mask with differential attenuation to improve ISO-dense proximityLIU HANG YIP·Filed 2010·Granted Jul 24, 2012·0 cites·15 claims
- 1041US11177318B2Semiconductor package and method of forming the sameAGENCY SCIENCE TECH & RES·Filed 2019·Granted Nov 16, 2021·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →