Inventor · disambiguated record
Hakon Mikkelsen
Also filed as: MIKKELSEN HAKON
8 granted patents·2 pending applications·83 citations·filing 2001–2019
83Inventor score
Files withLEICA MICROSYSTEMS4CONDUCTA ENDRESS & HAUSER2MIKKELSEN HAKON2BAYERISCHE MOTOREN WERKE AG1BECKER KLAUS1
Top patents by PatentIndex Score
10 records- 0187US6600560B2Optical measurement arrangement having an ellipsometerLEICA MICROSYSTEMS·Filed 2001·Granted Jul 29, 2003·56 cites·13 claims
- 0273US8581194B2Method and apparatus for measuring a spectrum of an optical sensor, advantageously in the infrared regionMIKKELSEN HAKON·Filed 2011·Granted Nov 12, 2013·3 cites·10 claims
- 0362US6826511B2Method and apparatus for the determination of layer thicknessesLEICA MICROSYSTEMS·Filed 2003·Granted Nov 30, 2004·12 cites·6 claims
- 0458US7860355B2ATR-probeCONDUCTA ENDRESS & HAUSER·Filed 2009·Granted Dec 28, 2010·1 cites·15 claims
- 0553US6618154B2Optical measurement arrangement, in particular for layer thickness measurementLEICA MICROSYSTEMS·Filed 2001·Granted Sep 9, 2003·7 cites·10 claims
- 0647US8086081B2Optical subassembly for in-and/or out-coupling of electromagnetic radiation into, and/or out of, a pressure-tight housingMIKKELSEN HAKON·Filed 2009·Granted Dec 27, 2011·0 cites·16 claims
- 0746US11187911B2Projection display with representation in multiple display planesBAYERISCHE MOTOREN WERKE AG·Filed 2019·Granted Nov 30, 2021·0 cites·8 claims
- 0846US6985237B2Method for determining layer thickness rangesLEICA MICROSYSTEMS·Filed 2003·Granted Jan 10, 2006·4 cites·2 claims
- 0944US2010303413A1Atr probeCONDUCTA ENDRESS & HAUSER·Filed 2008·Application pending·0 cites
- 1037US2011069379A1Microscope Configuration DeterminationBECKER KLAUS·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →