Inventor · disambiguated record
Hans F. Nix
Also filed as: NIX HANS · NIX HANS F
8 granted patents·159 citations·filing 1975–1997
88Inventor score
Files withNIX STEINGROEVE ELEKTRO PHYSIK6ELEKTRO PHYS HANS NIX & DR ING E STEINGROEVER GMBH & CO1NIX ELEKTRO PHYSIK HANS1
Top patents by PatentIndex Score
8 records- 0194US3986105ADual purpose electromagnetic thickness gaugeNIX STEINGROEVE ELEKTRO PHYSIK·Filed 1975·Granted Oct 12, 1976·61 cites·22 claims
- 0274US6011391AProbe for measuring thin layers using a magnetic or eddy current processNIX ELEKTRO PHYSIK HANS·Filed 1997·Granted Jan 4, 2000·39 cites·40 claims
- 0364US4392305APencil shaped magnetic coating thickness gaugeNIX STEINGROEVE ELEKTRO PHYSIK·Filed 1981·Granted Jul 12, 1983·21 cites·17 claims
- 0460USD345312SCoating thickness gageELEKTRO PHYS HANS NIX & DR ING E STEINGROEVER GMBH & CO·Filed 1992·Granted Mar 22, 1994·12 cites·1 claims
- 0540US5394085ARolling probe for the continuous measuring of the thickness of layers or stripsNIX STEINGROEVE ELEKTRO PHYSIK·Filed 1992·Granted Feb 28, 1995·11 cites·14 claims
- 0638US4160208AMethod of calibrating magnetic thickness gaugesNIX STEINGROEVE ELEKTRO PHYSIK·Filed 1976·Granted Jul 3, 1979·5 cites·8 claims
- 0736US4692700ARolling magnetic probe for continuous thickness measurementNIX STEINGROEVE ELEKTRO PHYSIK·Filed 1985·Granted Sep 8, 1987·6 cites·22 claims
- 0833US4403188APositively actuated brake for manually operable magnetic thickness gaugesNIX STEINGROEVE ELEKTRO PHYSIK·Filed 1981·Granted Sep 6, 1983·4 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →