Inventor · disambiguated record
Hans-Dieter Oberle
Also filed as: OBERLE HANS D · OBERLE HANS-DIETER
11 granted patents·133 citations·filing 1988–2006
90Inventor score
Top patents by PatentIndex Score
11 records- 0178US5293386AIntegrated semiconductor memory with parallel test capability and redundancy methodSIEMENS AG·Filed 1992·Granted Mar 8, 1994·46 cites·83 claims
- 0277US7453282B2Input and output circuit of an integrated circuit and a method for testing the sameINFINEON TECHNOLOGIES AG·Filed 2006·Granted Nov 18, 2008·10 cites·13 claims
- 0371US4956819ACircuit configuration and a method of testing storage cellsSIEMENS AG·Filed 1988·Granted Sep 11, 1990·19 cites·9 claims
- 0464US4922134ATestable redundancy decoder of an integrated semiconductor memorySIEMENS AG·Filed 1989·Granted May 1, 1990·20 cites·8 claims
- 0563US6944810B2Method and apparatus for the testing of input/output drivers of a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 13, 2005·11 cites·45 claims
- 0652US4885748AMethod and circuit configuration of the parallel input of data into a semiconductor memorySIEMENS AG·Filed 1988·Granted Dec 5, 1989·13 cites·13 claims
- 0748US7487060B2Apparatus and method for tolerance analysis for digital and/or digitized measure valuesINFINEON TECHNOLOGIES AG·Filed 2004·Granted Feb 3, 2009·4 cites·27 claims
- 0845US7254502B2Method and device for detecting period length fluctuations of periodic signalsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Aug 7, 2007·0 cites·19 claims
- 0935US5497350AIntegrated semiconductor memory device capable of switching from a memory mode to an internal test modeSIEMENS AG·Filed 1994·Granted Mar 5, 1996·6 cites·10 claims
- 1033US5253209AIntegrated semiconductor memorySIEMENS AG·Filed 1991·Granted Oct 12, 1993·4 cites·13 claims
- 1129USRE36061EIntegrated semiconductor memorySIEMENS AG·Filed 1995·Granted Jan 26, 1999·0 cites·13 claims
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