Inventor · disambiguated record
Haruyoshi Ono
Also filed as: ONO HARUYOSHI
16 granted patents·6 pending applications·26 citations·filing 2002–2022
89Inventor score
Top patents by PatentIndex Score
22 records- 0190US11714279B2Vehicle display deviceYAZAKI CORP·Filed 2022·Granted Aug 1, 2023·3 cites·3 claims
- 0268US8506102B2Indicator and display apparatusONO HARUYOSHI·Filed 2011·Granted Aug 13, 2013·2 cites·10 claims
- 0357US8120506B2Display unit having a dial and a central displayONO HARUYOSHI·Filed 2009·Granted Feb 21, 2012·4 cites·8 claims
- 0455US7921343B2Testing system, testing system control method, and test apparatusEUDYNA DEVICES INC·Filed 2007·Granted Apr 5, 2011·2 cites·13 claims
- 0553US6748746B2Device and method for controlling temperature of semiconductor moduleFUJITSU QUANTUM DEVICES LTD·Filed 2002·Granted Jun 15, 2004·6 cites·12 claims
- 0652US6807199B2Wavelength inspection method of a semiconductor laser diode and a wavelength inspection unit thereofFUJITSU QUANTUM DEVICES LTD·Filed 2002·Granted Oct 19, 2004·3 cites·16 claims
- 0751US6822984B2Device for and method of testing semiconductor laser moduleFUJITSU QUANTUM DEVICES LTD·Filed 2002·Granted Nov 23, 2004·3 cites·10 claims
- 0850US7614801B2Optical axis adjusting method, optical module producing method, optical axis adjusting apparatus, and optical moduleEUDYNA DEVICES INC·Filed 2007·Granted Nov 10, 2009·1 cites·12 claims
- 0950US2015156885A1Method for manufacturing an electric device by connecting a wiring board to an object and electric device including a boardSEDI INC·Filed 2014·Application pending·0 cites
- 1049US9279848B2Test apparatusSEDI INC·Filed 2014·Granted Mar 8, 2016·0 cites·5 claims
- 1149US7907650B2Laser module, control method of the same, control data of the same, and control data generation methodEUDYNA DEVICES INC·Filed 2006·Granted Mar 15, 2011·0 cites·19 claims
- 1247US2011158269A1Laser module, control method of the same, control data of the same, and control data generation methodEUDYNA DEVICES INC·Filed 2011·Application pending·0 cites
- 1346US8783207B2Meter pointer deviceONO HARUYOSHI·Filed 2011·Granted Jul 22, 2014·0 cites·3 claims
- 1446US2008315078A1Wavelength measuring device, light receiving unit, and wavelength measuring methodEUDYNA DEVICES INC·Filed 2008·Application pending·0 cites
- 1544US7316510B2Optical axis adjusting method, optical module producing method, optical axis adjusting apparatus, and optical moduleEUDYNA DEVICES INC·Filed 2004·Granted Jan 8, 2008·2 cites·3 claims
- 1642US8248587B2Testing method of semiconductor laser and laser testing deviceONO HARUYOSHI·Filed 2010·Granted Aug 21, 2012·0 cites·9 claims
- 1742US7411178B2Wavelength measuring device for a single light receiving element and wavelength measuring method at different temperaturesEUDYNA DEVICES INC·Filed 2004·Granted Aug 12, 2008·0 cites·6 claims
- 1841US2004008995A1Optical communication module and wavelength locker moduleFUJITSU QUANTUM DEVICES LTD·Filed 2003·Application pending·0 cites
- 1940US7757136B2Testing system, testing system control method, and test apparatusEUDYNA DEVICES INC·Filed 2007·Granted Jul 13, 2010·0 cites·14 claims
- 2039US7644326B2Testing system and testing system control methodEUDYNA DEVICES INC·Filed 2007·Granted Jan 5, 2010·0 cites·7 claims
- 2139US2011252860A1Method for controlling testing apparatusSEDI INC·Filed 2011·Application pending·0 cites
- 2238US2003234924A1Optical device measuring apparatus and light receiving unit available for such optical device measuring apparatusFUJITSU QUANTUM DEVICES LTD·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →