Inventor · disambiguated record
Hae Jun Park
Also filed as: PARK HAE JUN
8 granted patents·4 pending applications·24 citations·filing 2001–2023
81Inventor score
Top patents by PatentIndex Score
12 records- 0197US10991302B1Gate driving circuit and display device using the sameLG DISPLAY CO LTD·Filed 2020·Granted Apr 27, 2021·12 cites·18 claims
- 0295US11798482B2Gate driver and organic light emitting display device including the sameLG DISPLAY CO LTD·Filed 2022·Granted Oct 24, 2023·3 cites·20 claims
- 0378US12230213B2Gate driver and organic light emitting display device including the sameLG DISPLAY CO LTD·Filed 2023·Granted Feb 18, 2025·0 cites·16 claims
- 0473US7495463B2System and method for transferring trays within a test handlerMIRAE CORP·Filed 2008·Granted Feb 24, 2009·8 cites·22 claims
- 0568US11367397B2Gate driver and organic light emitting display device including the sameLG DISPLAY CO LTD·Filed 2020·Granted Jun 21, 2022·0 cites·10 claims
- 0655US7772834B2Handler and process for testing a semiconductor chips using the handlerMIRAE CORP·Filed 2008·Granted Aug 10, 2010·1 cites·17 claims
- 0745US8613871B2Conductive nanocomplex and method of manufacturing the samePARK HAE JUN·Filed 2010·Granted Dec 24, 2013·0 cites·7 claims
- 0843US2016086737A1Electrode for dye-sensitized solar cell and manufacturing method thereforKOREA ATOMIC ENERGY RES·Filed 2014·Application pending·0 cites
- 0942US2004116296A1Method for producing the sustained-releasing agricultural chemicalsFiled 2001·Application pending·0 cites
- 1041US2009237089A1Apparatus for transferring packaged chips, test handler and method for manufacturing packaged chipsCHO JAE KYUNG·Filed 2008·Application pending·0 cites
- 1140US2008012113A1Carrier module and test tray for an upright-positionable packaged chip, and testing methodMIRAE CORP·Filed 2007·Application pending·0 cites
- 1238US9285420B2Apparatus for spinning test tray of in-line test handler and in-line test handlerMIRAE CORP·Filed 2014·Granted Mar 15, 2016·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →