Inventor · disambiguated record
Hans Thielemans
Also filed as: THIELEMANS HANS
1 granted patent·3 pending applications·2 citations·filing 2012–2017
19Inventor score
Top patents by PatentIndex Score
4 records- 0164US10267629B2Measurement probe unit for metrology applicationsNIKON METROLOGY NV·Filed 2015·Granted Apr 23, 2019·2 cites·23 claims
- 0239US2018135969A1System for measuring the position and movement of an objectNIKON METROLOGY N V·Filed 2017·Application pending·0 cites
- 0328US2015377606A1Projection systemNIKON METROLOGY N V·Filed 2014·Application pending·0 cites
- 0427US2014043622A1System for measuring the position and movement of an objectVANDENHOUDT GEERT·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →