Inventor · disambiguated record
Han-Yen Tu
Also filed as: TU HAN-YEN
2 granted patents·6 citations·filing 2017–2019
44Inventor score
Files withUNIV NAT TAIWAN NORMAL2
Top patents by PatentIndex Score
2 records- 0184US10983478B2Complex defect diffraction model and method for defect inspection of transparent substrateUNIV NAT TAIWAN NORMAL·Filed 2019·Granted Apr 20, 2021·6 cites·18 claims
- 0246US10234268B2Method and apparatus for digital holographic microtomographyUNIV NAT TAIWAN NORMAL·Filed 2017·Granted Mar 19, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →