Inventor · disambiguated record
Henry Au
Also filed as: AU HENRY · AU HENRY H
2 granted patents·1 pending application·8 citations·filing 1997–2016
46Inventor score
Files withKAMIN NACKIEB M2
Top patents by PatentIndex Score
3 records- 0127US6051844AScanning system for rapid thermal cycle stress/curvature measurementFiled 1997·Granted Apr 18, 2000·8 cites·5 claims
- 0226US2016078153A1Subthreshold standard cell logic libraryKAMIN NACKIEB M·Filed 2012·Application pending·0 cites
- 0325US9529953B2Subthreshold standard cell libraryKAMIN NACKIEB M·Filed 2016·Granted Dec 27, 2016·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →