Inventor · disambiguated record
Hee Gyu Baek
Also filed as: BAEK HEE GYU
2 granted patents·1 citations·filing 2017–2019
35Inventor score
Technology areasH04N
Files withHANWHA TECHWIN CO LTD2
Top patents by PatentIndex Score
2 records- 0163US10362307B2Quantization parameter determination method and image capture apparatusHANWHA TECHWIN CO LTD·Filed 2017·Granted Jul 23, 2019·1 cites·19 claims
- 0254US10999577B2Quantization parameter determination method and image capture apparatusHANWHA TECHWIN CO LTD·Filed 2019·Granted May 4, 2021·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →