Inventor · disambiguated record
Herbert Benzinger
Also filed as: BENZINGER HERBERT
16 granted patents·6 pending applications·69 citations·filing 2000–2006
92Inventor score
Top patents by PatentIndex Score
22 records- 0168US7443713B2Integrated semiconductor memory and method for operating a semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2006·Granted Oct 28, 2008·3 cites·22 claims
- 0268US7206238B2Integrated semiconductor memory comprising at least one word line and methodINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 17, 2007·7 cites·16 claims
- 0362US7482644B2Integrated semiconductor memory and method for electrically stressing an integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 27, 2009·5 cites·14 claims
- 0462US6664167B2Memory with trench capacitor and selection transistor and method for fabricating itINFINEON TECHNOLOGIES AG·Filed 2002·Granted Dec 16, 2003·9 cites·24 claims
- 0561US6326262B1Method for fabricating epitaxy layerINFINEON TECHNOLOGIES AG·Filed 2000·Granted Dec 4, 2001·8 cites·10 claims
- 0658US7266027B2Integrated semiconduct memory with test circuitINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 4, 2007·4 cites·19 claims
- 0758US7180820B2Integrated semiconductor memory comprising at least one word line and comprising a multiplicity of memory cellsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 20, 2007·4 cites·23 claims
- 0853US7102912B2Integrated semiconductor memory device and method for operating an integrated semiconductor memory deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 5, 2006·3 cites·28 claims
- 0950US6638814B1Method for producing an insulationINFINEON TECHNOLOGIES AG·Filed 2000·Granted Oct 28, 2003·5 cites·16 claims
- 1050US6639861B2Integrated memory and method for testing an integrated memoryINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 28, 2003·7 cites·7 claims
- 1144US6556486B2Circuit configuration and method for synchronizationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 29, 2003·4 cites·17 claims
- 1243US6750509B2DRAM cell configuration and method for fabricating the DRAM cell configurationINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 15, 2004·2 cites·13 claims
- 1342US2005133785A1Device and method for detecting the overheating of a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2004·Application pending·0 cites
- 1441US7120074B2Semiconductor memory and method for operating a semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Oct 10, 2006·3 cites·25 claims
- 1540US6999355B2Circuit arrangement and method for setting a voltage supply for a read/write amplifier of an integrated memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Feb 14, 2006·3 cites·4 claims
- 1640US2007176255A1Integrated circuit arrangementKREUPL FRANZ·Filed 2006·Application pending·0 cites
- 1738US6970389B2Integrated memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Nov 29, 2005·2 cites·4 claims
- 1833US2007047355A1Method for detecting a leakage current of a semiconductor memoryQIMONDA AG·Filed 2006·Application pending·0 cites
- 1932US7248536B2Integrated semiconductor memory and method for operating an integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 24, 2007·0 cites·25 claims
- 2031US2003156446A1Integrated memory circuit having storage capacitors which can be written to via word lines and bit linesFiled 2003·Application pending·0 cites
- 2130US2002075748A1Input circuit for an integrated memoryFiled 2001·Application pending·0 cites
- 2227US2003002351A1Integrated memory circuit and method for reading a data item from a memory cellFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →