Inventor · disambiguated record
Hemant Deshpande
Also filed as: DESHPANDE HEMANT · DESHPANDE HEMANT V · DESHPANDE HEMANT VINAYAK
9 granted patents·1 pending application·30 citations·filing 2005–2017
84Inventor score
Top patents by PatentIndex Score
10 records- 0186US8193049B2Methods of channel stress engineering and structures formed therebyGOLONZKA OLEG·Filed 2008·Granted Jun 5, 2012·14 cites·13 claims
- 0282US7422950B2Strained silicon MOS device with box layer between the source and drain regionsINTEL CORP·Filed 2005·Granted Sep 9, 2008·10 cites·13 claims
- 0374US8779477B2Enhanced dislocation stress transistorWEBER CORY·Filed 2008·Granted Jul 15, 2014·4 cites·10 claims
- 0468US9312389B2FinFET with undoped body bulkBROADCOM CORP·Filed 2014·Granted Apr 12, 2016·2 cites·20 claims
- 0560US10084087B2Enhanced dislocation stress transistorINTEL CORP·Filed 2017·Granted Sep 25, 2018·0 cites·20 claims
- 0660US9231076B2Enhanced dislocation stress transistorINTEL CORP·Filed 2014·Granted Jan 5, 2016·0 cites·12 claims
- 0758US9076814B2Enhanced dislocation stress transistorINTEL CORP·Filed 2014·Granted Jul 7, 2015·0 cites·16 claims
- 0857US9660078B2Enhanced dislocation stress transistorINTEL CORP·Filed 2015·Granted May 23, 2017·0 cites·13 claims
- 0949US8716806B2Methods of channel stress engineering and structures formed therebyGOLONZKA OLEG·Filed 2012·Granted May 6, 2014·0 cites·27 claims
- 1039US2007132034A1Isolation body for semiconductor devices and method to form the sameCURELLO GIUSEPPE·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →