Inventor · disambiguated record
Herbert Leiter
Also filed as: LEITER HERBERT · REINHEIMER GUNTER
12 granted patents·246 citations·filing 1977–1997
92Inventor score
Top patents by PatentIndex Score
12 records- 0188US4844744ALiquid, phosphate-free single phase degreasing compositionsHENKEL KGAA·Filed 1988·Granted Jul 4, 1989·51 cites·33 claims
- 0282US5022744AMicroscope with a camera and automatic color temperature balanceLEITZ WILD GMBH·Filed 1989·Granted Jun 11, 1991·49 cites·5 claims
- 0378US4302087AMicroscope attachment cameraLEITZ ERNST GMBH·Filed 1980·Granted Nov 24, 1981·36 cites·6 claims
- 0474US4820436ADetergents for low laundering temperaturesHENKEL KGAA·Filed 1986·Granted Apr 11, 1989·36 cites·7 claims
- 0568US4174159AExposure meter for photomicrographyLEITZ ERNST GMBH·Filed 1978·Granted Nov 13, 1979·22 cites·15 claims
- 0663US5124438AChemically modified proteins and colorant formulations containing the sameBASF AG·Filed 1990·Granted Jun 23, 1992·15 cites·16 claims
- 0760US6117224ADye preparationsBASF AG·Filed 1997·Granted Sep 12, 2000·15 cites·6 claims
- 0843US4118719AMicroscope attachment cameraLEITZ ERNST GMBH·Filed 1977·Granted Oct 3, 1978·8 cites·10 claims
- 0933US4814814AProcess and device for the introduction, visualization and/or recording of a variable metering spot into a ray path of a camera for optical instrumentsLEITZ ERNST GMBH·Filed 1988·Granted Mar 21, 1989·4 cites·39 claims
- 1032US4152054ALight-metering system in attachment camera for observation instruments, especially microscopesLEITZ ERNST GMBH·Filed 1978·Granted May 1, 1979·3 cites·15 claims
- 1132US4132891AExposure measuring system for microscope attached camerasLEITZ ERNST GMBH·Filed 1977·Granted Jan 2, 1979·3 cites·5 claims
- 1230US4837595AProcess and device for photographing microscopic objectsLEITZ ERNST GMBH·Filed 1987·Granted Jun 6, 1989·4 cites·16 claims
Join the waitlist — get patent alerts
Get an alert when Herbert Leiter files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →