Inventor · disambiguated record
Heung-Jo Ryuk
Also filed as: RYUK HEUNG-JO
2 granted patents·1 pending application·38 citations·filing 1999–2002
63Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
3 records- 0163US6501189B1Alignment mark of semiconductor wafer for use in aligning the wafer with exposure equipment, alignment system for producing alignment signals from the alignment mark, and method of determining the aligned state of a wafer from the alignment markSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Dec 31, 2002·29 cites·4 claims
- 0258US7038777B2Semiconductor wafer bearing alignment mark for use in aligning the wafer with exposure equipment, alignment system for producing alignment signals from the alignment mark, and method of determining the aligned state of a wafer from the alignment markSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted May 2, 2006·9 cites·2 claims
- 0318US2001003480A1Apertures and illuminating apparatus including aperture openings dimensioned to compensate for directional critical dimension differencesFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →