Inventor · disambiguated record
Heiko Stegmann
Also filed as: STEGMANN HEIKO
5 granted patents·4 pending applications·12 citations·filing 2002–2024
69Inventor score
Top patents by PatentIndex Score
9 records- 0188US12196941B2Sample holder system with freely settable inclination anglesZEISS CARL MICROSCOPY GMBH·Filed 2022·Granted Jan 14, 2025·2 cites·20 claims
- 0280US9816946B2Methods and apparatus for the preparation of microscopy samples by using pulsed lightSTEGMANN HEIKO·Filed 2013·Granted Nov 14, 2017·9 cites·21 claims
- 0376US10796881B2Method for processing an objectZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted Oct 6, 2020·1 cites·27 claims
- 0468US12480864B2Methods for creating a trench in a sample, and computer program productZEISS CARL MICROSCOPY GMBH·Filed 2023·Granted Nov 25, 2025·0 cites·20 claims
- 0557US2024347312A1Device and method for preparing microscopic samples via backside thinningZEISS CARL MICROSCOPY GMBH·Filed 2024·Application pending·0 cites
- 0656US2023260744A1Method for producing a sample on an object, computer program product, and material processing device for carrying out the methodZEISS CARL MICROSCOPY GMBH·Filed 2022·Application pending·0 cites
- 0740US10854421B2Charged particle beam system and methodZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted Dec 1, 2020·0 cites·24 claims
- 0828US2013234011A2Method for setting an operating parameter of a particle beam device and a sample holder for performing the methodNIEBEL HARALD·Filed 2010·Application pending·0 cites
- 0925US2003222215A1Method for objective and accurate thickness measurement of thin films on a microscopic scaleFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →