Inventor · disambiguated record
Hiroshi Akahori
Also filed as: AKAHORI HIROSHI
50 granted patents·19 pending applications·1,273 citations·filing 1990–2022
98Inventor score
Files withTOSHIBA KK21AKAHORI HIROSHI9HAMAMATSU PHOTONICS KK8MATSUSHITA ELECTRIC INDUSTRIAL CO LTD8TAKEUCHI WAKAKO5
Top patents by PatentIndex Score
69 records- 0198US6713824B1Reliable semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 1999·Granted Mar 30, 2004·527 cites·23 claims
- 0294US7663195B2P-channel power MIS field effect transistor and switching circuitOHMI TADAHIRO·Filed 2005·Granted Feb 16, 2010·31 cites·17 claims
- 0393US6133928AImage recording apparatus, image data generating apparatus, and recording methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Oct 17, 2000·44 cites·59 claims
- 0493US5809202ARecording medium, an apparatus for recording a moving image, an apparatus and a system for generating a digest of a moving image, and a method of the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Sep 15, 1998·83 cites·9 claims
- 0590US9269718B1Manufacturing method of semiconductor memory deviceTOSHIBA KK·Filed 2015·Granted Feb 23, 2016·9 cites·8 claims
- 0689US7928518B2P-channel power MIS field effect transistor and switching circuitYAZAKI CORP·Filed 2009·Granted Apr 19, 2011·14 cites·30 claims
- 0785US5801765AScene-change detection method that distinguishes between gradual and sudden scene changesMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Sep 1, 1998·117 cites·4 claims
- 0884US7414285B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2007·Granted Aug 19, 2008·10 cites·20 claims
- 0984US6031274ABack irradiation type light-receiving device and method of making the sameHAMAMATSU PHOTONICS KK·Filed 1997·Granted Feb 29, 2000·75 cites·3 claims
- 1084US5237405AImage motion vector detecting device and swing correcting deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1991·Granted Aug 17, 1993·67 cites·10 claims
- 1179US7651914B2Manufacturing method of a nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2008·Granted Jan 26, 2010·7 cites·16 claims
- 1278US8183670B2Semiconductor device and method of manufacturing the sameOHMI TADAHIRO·Filed 2007·Granted May 22, 2012·4 cites·4 claims
- 1378US7179746B2Method of surface treatment for manufacturing semiconductor deviceFOUND ADVANCEMENT INT SCIENCE·Filed 2003·Granted Feb 20, 2007·16 cites·10 claims
- 1478US6909993B2Method for diagnosing failure of a manufacturing apparatus and a failure diagnosis systemTOSHIBA KK·Filed 2002·Granted Jun 21, 2005·20 cites·17 claims
- 1578US6204506B1Back illuminated photodetector and method of fabricating the sameHAMAMATSU PHOTONICS KK·Filed 1998·Granted Mar 20, 2001·53 cites·11 claims
- 1677US7928496B2Semiconductor memory device and manufacturing method thereofTOSHIBA KK·Filed 2007·Granted Apr 19, 2011·6 cites·6 claims
- 1777US6078726ARecording medium, an apparatus for recording a moving image, an apparatus and a system for generating a digest of a moving image, and a method of the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Jun 20, 2000·52 cites·6 claims
- 1876US7906804B2Nonvolatile semiconductor memory device and manufacturing method thereofTOSHIBA KK·Filed 2007·Granted Mar 15, 2011·5 cites·12 claims
- 1971US6723994B2Semiconductor energy detectorHAMAMATSU PHOTONICS KK·Filed 2002·Granted Apr 20, 2004·15 cites·7 claims
- 2070US6889239B2Digital filter and data processing method thereofYOKOGAWA ELECTRIC CORP·Filed 2001·Granted May 3, 2005·13 cites·5 claims
- 2168US8133782B2Nonvolatile semiconductor memory device and manufacturing method thereofAKAHORI HIROSHI·Filed 2011·Granted Mar 13, 2012·2 cites·5 claims
- 2268US6724062B2Semiconductor energy detectorHAMAMATSU PHOTONICS KK·Filed 2001·Granted Apr 20, 2004·13 cites·7 claims
- 2366US7821056B2Nonvolatile semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2007·Granted Oct 26, 2010·2 cites·16 claims
- 2462US6772045B2System for determining dry cleaning timing, method for determining dry cleaning timing, dry cleaning method, and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2002·Granted Aug 3, 2004·8 cites·27 claims
- 2559US2023093809A1Diagnostic device, diagnostic method, and non-transitory computer-readable recording medium storing diagnostic instructionsYOKOGAWA ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 2655US7829950B2Nonvolatile semiconductor memory and method of manufacturing the sameTOSHIBA KK·Filed 2008·Granted Nov 9, 2010·0 cites·9 claims
- 2755US7514687B2Energy ray detecting elementHAMAMATSU PHOTONICS KK·Filed 2004·Granted Apr 7, 2009·3 cites·4 claims
- 2855US7148551B2Semiconductor energy detectorHAMAMATSU PHOTONICS KK·Filed 2002·Granted Dec 12, 2006·5 cites·15 claims
- 2954US6171977B1Semiconductor device applied to composite insulative film manufacturing method thereofTOSHIBA KK·Filed 1996·Granted Jan 9, 2001·17 cites·15 claims
- 3052US5249257AFuzzy regression data processing deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1990·Granted Sep 28, 1993·14 cites·3 claims
- 3151US8450787B2Nonvolatile semiconductor memory and method of manufacturing the sameAKAHORI HIROSHI·Filed 2011·Granted May 28, 2013·0 cites·12 claims
- 3251US2012208375A1Semiconductor device and method of manufacturing the sameOHMI TADAHIRO·Filed 2012·Application pending·0 cites
- 3351US2023098799A1Diagnostic device, diagnostic method, and non-transitory computer-readable recording mediumYOKOGAWA ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 3450US8330206B2Nonvolatile semiconductor memory device and manufacturing method thereofAKAHORI HIROSHI·Filed 2012·Granted Dec 11, 2012·0 cites·15 claims
- 3550US7732277B2Semiconductor device and method of fabricating the sameTOSHIBA KK·Filed 2007·Granted Jun 8, 2010·0 cites·15 claims
- 3649US8895410B2Method of manufacturing semiconductor device and semiconductor manufacturing apparatusOHMI TADAHIRO·Filed 2005·Granted Nov 25, 2014·0 cites·31 claims
- 3748US6841850B2Semiconductor device having silicon nitride film and silicon oxide film, and method of fabricating the sameTOSHIBA KK·Filed 2002·Granted Jan 11, 2005·1 cites·9 claims
- 3847US8243175B2Solid-state imaging deviceKOBAYASHI HIROYA·Filed 2004·Granted Aug 14, 2012·0 cites·4 claims
- 3947US8071444B2Nonvolatile semiconductor memory and method of manufacturing the sameAKAHORI HIROSHI·Filed 2010·Granted Dec 6, 2011·0 cites·3 claims
- 4047US6710802B2Image recording apparatus and image reproducing apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Mar 23, 2004·12 cites·29 claims
- 4146US2010102448A1Semiconductor device and method of fabricating the sameAKAHORI HIROSHI·Filed 2009·Application pending·0 cites
- 4245US8030182B2Semiconductor device manufacturing method and semiconductor manufacturing apparatusTADAHIRO OHMI·Filed 2005·Granted Oct 4, 2011·0 cites·22 claims
- 4345US6992020B2Method of fabricating semiconductor deviceTOSHIBA KK·Filed 2004·Granted Jan 31, 2006·0 cites·12 claims
- 4444US7589775B2Solid-state imaging deviceHAMAMATSU PHOTONICS KK·Filed 2004·Granted Sep 15, 2009·0 cites·3 claims
- 4544US2011163368A1Semiconductor Memory Device and Manufacturing Method ThereofTOSHIBA KK·Filed 2011·Application pending·0 cites
- 4644US2010295134A1Semiconductor memory device and method of fabricating the sameNAGASHIMA SATOSHI·Filed 2009·Application pending·0 cites
- 4743US2009026529A1Semiconductor device and method for manufacturing the sameAKAHORI HIROSHI·Filed 2008·Application pending·0 cites
- 4843US2010207188A1Semiconductor device and method of fabricating the sameTOSHIBA KK·Filed 2010·Application pending·0 cites
- 4943US2008211005A1Semiconductor deviceAKAHORI HIROSHI·Filed 2007·Application pending·0 cites
- 5042US5280471AArrangement and method for detecting interference in TDMA communications systemNEC CORP·Filed 1991·Granted Jan 18, 1994·12 cites·6 claims
Showing the top 50 of 69 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →