Inventor · disambiguated record
Hiroteru Akiyama
Also filed as: AKIYAMA HIROTERU
6 granted patents·10 citations·filing 2010–2019
72Inventor score
Top patents by PatentIndex Score
6 records- 0191US9922415B2Inspection method, inspection apparatus, and inspection systemNUFLARE TECHNOLOGY INC·Filed 2016·Granted Mar 20, 2018·6 cites·11 claims
- 0279US10540561B2Inspection method and inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2018·Granted Jan 21, 2020·2 cites·8 claims
- 0363US9165355B1Inspection methodNUFLARE TECHNOLOGY INC·Filed 2014·Granted Oct 20, 2015·2 cites·12 claims
- 0446US11145050B2Pattern inspection apparatus and pattern inspection methodNUFLARE TECHNOLOGY INC·Filed 2019·Granted Oct 12, 2021·0 cites·10 claims
- 0539US10578560B2Inspection apparatus and method for detecting false defectsAKIYAMA HIROTERU·Filed 2012·Granted Mar 3, 2020·0 cites·2 claims
- 0632US8755599B2Review apparatus and inspection systemAKIYAMA HIROTERU·Filed 2010·Granted Jun 17, 2014·0 cites·10 claims
Join the waitlist — get patent alerts
Get an alert when Hiroteru Akiyama files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →