Inventor · disambiguated record
Hideyuki Aoki
Also filed as: AOKI HIDEYUKI
35 granted patents·4 pending applications·569 citations·filing 1986–2014
98Inventor score
Top patents by PatentIndex Score
39 records- 0191US7200394B2Information distribution service system based on predicted changes in location of mobile information terminalFUJITSU LTD·Filed 2003·Granted Apr 3, 2007·85 cites·13 claims
- 0289US6507204B1Semiconductor testing equipment with probe formed on a cantilever of a substrateHITACHI LTD·Filed 2000·Granted Jan 14, 2003·40 cites·14 claims
- 0389US6222406B1Semiconductor integrated circuit device, semiconductor memory system and clock synchronous circuitHITACHI LTD·Filed 1998·Granted Apr 24, 2001·55 cites·30 claims
- 0487US4711138AAutomatic transmission mechanismAISIN WARNER·Filed 1986·Granted Dec 8, 1987·40 cites·7 claims
- 0586US6358762B1Manufacture method for semiconductor inspection apparatusHITACHI LTD·Filed 2000·Granted Mar 19, 2002·38 cites·16 claims
- 0678US7356742B2Method and apparatus for testing a memory device in quasi-operating conditionsRENESAS TECH CORP·Filed 2005·Granted Apr 8, 2008·12 cites·13 claims
- 0778US6496023B1Semiconductor-device inspecting apparatus and a method for manufacturing the sameHITACHI LTD·Filed 2000·Granted Dec 17, 2002·20 cites·12 claims
- 0877US6531327B2Method for manufacturing semiconductor device utilizing semiconductor testing equipmentHITACHI LTD·Filed 2002·Granted Mar 11, 2003·17 cites·21 claims
- 0975US6774654B2Semiconductor-device inspecting apparatus and a method for manufacturing the sameRENESAS TECH CORP·Filed 2002·Granted Aug 10, 2004·16 cites·14 claims
- 1073US6414530B2Semiconductor integrated circuit device, semiconductor memory system and clock synchronous circuitHITACHI LTD·Filed 2001·Granted Jul 2, 2002·19 cites·16 claims
- 1172US5232418AHydraulic actuator in automatic transmissionAISIN AW CO·Filed 1991·Granted Aug 3, 1993·23 cites·11 claims
- 1271US7341133B2Hydraulic circuit and hydraulic control unit for hydraulic power transmissionAISIN AW CO·Filed 2005·Granted Mar 11, 2008·6 cites·11 claims
- 1371US4722242AAutomatic transmissionAISIN WARNER·Filed 1986·Granted Feb 2, 1988·23 cites·10 claims
- 1470US6828810B2Semiconductor device testing apparatus and method for manufacturing the sameRENESAS TECH CORP·Filed 2002·Granted Dec 7, 2004·14 cites·13 claims
- 1567US4716787AAutomatic transmission mechanismAISIN WARNER·Filed 1986·Granted Jan 5, 1988·20 cites·6 claims
- 1666US6826720B2Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memoryRENESAS TECH CORP·Filed 2001·Granted Nov 30, 2004·13 cites·13 claims
- 1762US6548315B2Manufacture method for semiconductor inspection apparatusHITACHI LTD·Filed 2002·Granted Apr 15, 2003·8 cites·7 claims
- 1861US6714030B2Semiconductor inspection apparatusHITACHI LTD·Filed 2003·Granted Mar 30, 2004·7 cites·5 claims
- 1960US6573112B2Semiconductor device manufacturing methodHITACHI LTD·Filed 2002·Granted Jun 3, 2003·6 cites·10 claims
- 2059US6566149B1Method for manufacturing substrate for inspecting semiconductor deviceHITACHI LTD·Filed 1998·Granted May 20, 2003·22 cites·14 claims
- 2159US2004122700A1Charge management method, charge device, network monitor device, web portal server, charge management program, content distribution server and charge management systemFiled 2003·Application pending·0 cites
- 2258US6978295B2Server apparatus for space information service, space information service providing method, and charge processing apparatus and charging method for space information serviceFUJITSU LTD·Filed 2001·Granted Dec 20, 2005·7 cites·38 claims
- 2358US4916977AAutomatic transmissionAISIN WARNER·Filed 1987·Granted Apr 17, 1990·15 cites·4 claims
- 2457US6955870B2Method of manufacturing a semiconductor deviceHITACHI LTD·Filed 2002·Granted Oct 18, 2005·6 cites·9 claims
- 2557US6952110B2Testing apparatus for carrying out inspection of a semiconductor deviceRENESAS TECH CORP·Filed 2004·Granted Oct 4, 2005·6 cites·4 claims
- 2655US8298652B2Injection molding die for producing molded product having appearance surface, injection molding method for producing molded product having appearance surface, and resin molded product molded by the injection molding methodAOKI HIDEYUKI·Filed 2008·Granted Oct 30, 2012·0 cites·5 claims
- 2754US7018857B2Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probeRENESAS TECH CORP·Filed 2003·Granted Mar 28, 2006·6 cites·17 claims
- 2854US6660541B2Semiconductor device and a manufacturing method thereofHITACHI LTD·Filed 2002·Granted Dec 9, 2003·6 cites·12 claims
- 2954US2002129119A1Information distribution device and information distribution methodFiled 2001·Application pending·0 cites
- 3051US8496470B2Injection molding die for producing a molded product having an appearance surfaceAOKI HIDEYUKI·Filed 2012·Granted Jul 30, 2013·0 cites·1 claims
- 3149US4813301AAutomatic transmissionAISIN WARNER·Filed 1987·Granted Mar 21, 1989·10 cites·4 claims
- 3248US6885208B2Semiconductor device and test device for sameRENESAS TECH CORP·Filed 2002·Granted Apr 26, 2005·3 cites·8 claims
- 3346US9150962B2Method for producing substrate with metal bodyJSR CORP·Filed 2014·Granted Oct 6, 2015·0 cites·10 claims
- 3446US7225372B2Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memoryRENESAS TECHNOLOGY CORP & HITA·Filed 2004·Granted May 29, 2007·6 cites·6 claims
- 3545US6479305B2Semiconductor device manufacturing methodHITACHI LTD·Filed 1999·Granted Nov 12, 2002·10 cites·13 claims
- 3642US7024604B2Process for manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2002·Granted Apr 4, 2006·3 cites·7 claims
- 3742US2003037013A1Web site access service providing systemFiled 2001·Application pending·0 cites
- 3840US5274594AStatic RAMHITACHI LTD·Filed 1992·Granted Dec 28, 1993·7 cites·4 claims
- 3929US2002046374A1Method of testing memory device, method of manufacturing memory device, apparatus for testing memory device, method of testing memory module, method of manufacturing memory module, apparatus for testing memory module and method of manufacturing computerFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →