Inventor · disambiguated record
Hisashi Ata
Also filed as: ATA HISASHI
9 granted patents·2 citations·filing 2015–2019
76Inventor score
Files withTEXAS INSTRUMENTS INC9
Top patents by PatentIndex Score
9 records- 0177US10114038B2Force biased spring probe pin assemblyTEXAS INSTRUMENTS INC·Filed 2015·Granted Oct 30, 2018·2 cites·25 claims
- 0265US11493535B2Systems and methods for depopulating pins from contactor test sockets for packaged semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2019·Granted Nov 8, 2022·0 cites·20 claims
- 0355US10539592B2Systems and methods for depopulating pins from contactor test sockets for packaged semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2016·Granted Jan 21, 2020·0 cites·19 claims
- 0443US11156638B2Contactors with signal pins, ground pins, and short ground pinsTEXAS INSTRUMENTS INC·Filed 2018·Granted Oct 26, 2021·0 cites·19 claims
- 0542US9698513B1Force biased spring probe pin assemblyTEXAS INSTRUMENTS INC·Filed 2015·Granted Jul 4, 2017·0 cites·6 claims
- 0642US9673539B2Spring biased contact pin assemblyTEXAS INSTRUMENTS INC·Filed 2015·Granted Jun 6, 2017·0 cites·7 claims
- 0738US9755344B2Force biased spring probe pin assemblyTEXAS INSTRUMENTS INC·Filed 2015·Granted Sep 5, 2017·0 cites·14 claims
- 0837US10126329B2Force biased spring probe pin assemblyTEXAS INSTRUMENTS INC·Filed 2015·Granted Nov 13, 2018·0 cites·31 claims
- 0935US10962571B2Interposers having cuts through an insulating substrateTEXAS INSTRUMENTS INC·Filed 2018·Granted Mar 30, 2021·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →