Inventor · disambiguated record
Hideaki Doi
Also filed as: DOI HIDEAKI
24 granted patents·1,064 citations·filing 1979–2003
97Inventor score
Top patents by PatentIndex Score
24 records- 0198US5801965AMethod and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devicesHITACHI LTD·Filed 1994·Granted Sep 1, 1998·230 cites·10 claims
- 0293US6546308B2Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devicesHITACHI LTD·Filed 2001·Granted Apr 8, 2003·61 cites·7 claims
- 0390US6438438B1Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devicesHITACHI LTD·Filed 1998·Granted Aug 20, 2002·84 cites·11 claims
- 0489US4628531APattern checking apparatusHITACHI LTD·Filed 1984·Granted Dec 9, 1986·100 cites·9 claims
- 0588US6614923B1Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereofHITACHI LTD·Filed 1999·Granted Sep 2, 2003·49 cites·30 claims
- 0686US6087673AMethod of inspecting pattern and apparatus thereofHITACHI LTD·Filed 1998·Granted Jul 11, 2000·58 cites·29 claims
- 0784US5754621AX-ray inspection method and apparatus, prepreg inspecting method, and method for fabricating multi-layer printed circuit boardHITACHI LTD·Filed 1996·Granted May 19, 1998·56 cites·46 claims
- 0882US6278418B1Three-dimensional imaging system, game device, method for same and recording mediumSEGA ENTERPRISES KK·Filed 1996·Granted Aug 21, 2001·120 cites·30 claims
- 0981US6236057B1Method of inspecting pattern and apparatus thereof with a differential brightness image detectionHITACHI LTD·Filed 2000·Granted May 22, 2001·15 cites·23 claims
- 1073US7263216B2Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereofHITACHI LTD·Filed 2003·Granted Aug 28, 2007·16 cites·16 claims
- 1173US6622054B1Method monitoring a quality of electronic circuits and its manufacturing condition and system for itHITACHI LTD·Filed 1999·Granted Sep 16, 2003·36 cites·16 claims
- 1273US6376854B2Method of inspecting a pattern on a substrateHITACHI LTD·Filed 2001·Granted Apr 23, 2002·8 cites·10 claims
- 1370US6650409B1Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same systemHITACHI LTD·Filed 1996·Granted Nov 18, 2003·39 cites·49 claims
- 1470US4908871APattern inspection systemHITACHI LTD·Filed 1987·Granted Mar 13, 1990·46 cites·9 claims
- 1567US6831998B1Inspection system for circuit patterns and a method thereofHITACHI LTD·Filed 2000·Granted Dec 14, 2004·26 cites·8 claims
- 1663US5331407AMethod and apparatus for detecting a circuit patternHITACHI LTD·Filed 1992·Granted Jul 19, 1994·25 cites·21 claims
- 1763US4962541APattern test apparatusHITACHI LTD·Filed 1988·Granted Oct 9, 1990·22 cites·5 claims
- 1859US6072899AMethod and device of inspecting three-dimensional shape defectHITACHI LTD·Filed 1998·Granted Jun 6, 2000·32 cites·20 claims
- 1953US4341837ALaminar thermoplastic resin structureKUREHA CHEMICAL IND CO LTD·Filed 1979·Granted Jul 27, 1982·11 cites·7 claims
- 2052US4975223AOptical materialKUREHA CHEMICAL IND CO LTD·Filed 1989·Granted Dec 4, 1990·8 cites·4 claims
- 2141US5930382AWiring pattern inspecting method and system for carrying out the sameHITACHI LTD·Filed 1996·Granted Jul 27, 1999·15 cites·32 claims
- 2238US5308875ATherapeutic coolant for the local treatment of burnNIPPON PETROCHEMICALS CO LTD·Filed 1993·Granted May 3, 1994·2 cites·2 claims
- 2335US4504631APhotoresist materialKUREHA CHEMICAL IND CO LTD·Filed 1983·Granted Mar 12, 1985·3 cites·14 claims
- 2431US5086140AOptical material formed by casting polymerization of a phenyl phosphine monomerKUREHA CHEMICAL IND CO LTD·Filed 1990·Granted Feb 4, 1992·2 cites·3 claims
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