Inventor · disambiguated record
Hisamitsu Endoh
Also filed as: ENDOH HISAMITSU
1 granted patent·2 pending applications·5 citations·filing 2006–2007
26Inventor score
Top patents by PatentIndex Score
3 records- 0171US7601957B2Electron microscope and combined illumination lensNAT UNIV CORP KYOTO INST TECH·Filed 2006·Granted Oct 13, 2009·5 cites·23 claims
- 0228US2008094710A1Fresnel Zone Plate and X-Ray Microscope Using the Fresnel Zone PlateKYOTO INST OF TECHNOLOGY·Filed 2007·Application pending·0 cites
- 0320US2009052619A1Fresnel zone plate and x-ray microscope using the fresnel zone plateENDOH HISAMITSU·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →