Inventor · disambiguated record
Hiroshi Fukiage
Also filed as: FUKIAGE HIROSHI
4 granted patents·1 pending application·367 citations·filing 1998–2004
84Inventor score
Top patents by PatentIndex Score
5 records- 0198US6400173B1Test system and manufacturing of semiconductor deviceHITACHI LTD·Filed 2000·Granted Jun 4, 2002·152 cites·12 claims
- 0296US6727723B2Test system and manufacturing of semiconductor deviceRENESAS TECH CORP·Filed 2002·Granted Apr 27, 2004·80 cites·15 claims
- 0390US6233182B1Semiconductor integrated circuit and method for testing memoryHITACHI LTD·Filed 1998·Granted May 15, 2001·81 cites·37 claims
- 0484US6467056B1Semiconductor integrated circuit and method of checking memoryHITACHI LTD·Filed 1999·Granted Oct 15, 2002·54 cites·3 claims
- 0538US2004175850A1Test system and manufacturing of semiconductor deviceRENESAS TECH CORP·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →