Inventor · disambiguated record
Hideaki Hashimoto
Also filed as: HASHIMOTO HIDEAKI
32 granted patents·14 pending applications·414 citations·filing 1980–2024
97Inventor score
Top patents by PatentIndex Score
46 records- 0193US9575010B2Inspection apparatus and inspection methodNUFLARE TECHNOLOGY INC·Filed 2016·Granted Feb 21, 2017·6 cites·20 claims
- 0292US7765023B2Robot controller and robot controlling methodTOSHIBA KK·Filed 2005·Granted Jul 27, 2010·54 cites·10 claims
- 0391US5373747ARobot hand and robotTOSHIBA KK·Filed 1992·Granted Dec 20, 1994·81 cites·9 claims
- 0490US6551493B2Ultraviolet light measuring chip and ultraviolet light sensor using the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Apr 22, 2003·53 cites·18 claims
- 0586US11004193B2Inspection method and inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2019·Granted May 11, 2021·2 cites·12 claims
- 0685US10997713B2Inspection device, inspection method, and storage mediumTOSHIBA KK·Filed 2019·Granted May 4, 2021·4 cites·17 claims
- 0785US4766322ARobot hand including optical approach sensing apparatusTOSHIBA KK·Filed 1986·Granted Aug 23, 1988·72 cites·3 claims
- 0884US5236031APneumatic radial tires for construction vehicleBRIDGESTONE CORP·Filed 1991·Granted Aug 17, 1993·56 cites·4 claims
- 0982US9646374B2Line width error obtaining method, line width error obtaining apparatus, and inspection systemNUFLARE TECHNOLOGY INC·Filed 2016·Granted May 9, 2017·4 cites·18 claims
- 1081US9978316B2Display apparatus and backlight drive methodEIZO CORP·Filed 2016·Granted May 22, 2018·3 cites·10 claims
- 1180US10712295B2Electron beam inspection apparatus and electron beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2019·Granted Jul 14, 2020·1 cites·20 claims
- 1279US11321042B2Display system and programEIZO CORP·Filed 2019·Granted May 3, 2022·3 cites·5 claims
- 1379US11099801B2Display system and programEIZO CORP·Filed 2019·Granted Aug 24, 2021·2 cites·14 claims
- 1478US9322388B2Natural-frequency adjusting mechanism for wave-power generatorHAYASHI KENTARO·Filed 2012·Granted Apr 26, 2016·4 cites·18 claims
- 1577US12382727B2Semiconductor chip, semiconductor device and manufacturing method of semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2024·Granted Aug 5, 2025·0 cites·1 claims
- 1677US11890994B2On-board bracket for on-board device at vehicleNIFCO INC·Filed 2021·Granted Feb 6, 2024·2 cites·16 claims
- 1777US9196033B2Inspection sensitivity evaluation methodNUFLARE TECHNOLOGY INC·Filed 2014·Granted Nov 24, 2015·4 cites·15 claims
- 1874US10775326B2Electron beam inspection apparatus and electron beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2019·Granted Sep 15, 2020·1 cites·11 claims
- 1971US7570005B2Wheeled moving robotTOSHIBA KK·Filed 2008·Granted Aug 4, 2009·7 cites·7 claims
- 2068US10846846B2Pattern inspection apparatus and pattern inspection methodNUFLARE TECHNOLOGY INC·Filed 2018·Granted Nov 24, 2020·1 cites·12 claims
- 2168US7397214B2Wheeled moving robotTOSHIBA KK·Filed 2006·Granted Jul 8, 2008·6 cites·3 claims
- 2265US11942471B2Semiconductor chip, semiconductor device and manufacturing method of semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2020·Granted Mar 26, 2024·0 cites·2 claims
- 2364US9021406B2Pattern inspection method of semiconductor device optical imageNUFLARE TECHNOLOGY INC·Filed 2014·Granted Apr 28, 2015·1 cites·16 claims
- 2461US4421344APressure-sensitive record color-developing sheetOJI PAPER CO·Filed 1982·Granted Dec 20, 1983·9 cites·6 claims
- 2560US2024213082A1Member for semiconductor manufacturing apparatus, plug, and method of manufacturing plugNGK INSULATORS LTD·Filed 2023·Application pending·0 cites
- 2660US2024213052A1Plug, method of manufacturing plug, and member for semiconductor manufacturing apparatusNGK INSULATORS LTD·Filed 2023·Application pending·0 cites
- 2759US2025273507A1Member for semiconductor manufacturing equipmentNGK INSULATORS LTD·Filed 2024·Application pending·0 cites
- 2859US2025285909A1Member for semiconductor manufacturing equipmentNGK INSULATORS LTD·Filed 2024·Application pending·0 cites
- 2957US10984525B2Pattern inspection method and pattern inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2019·Granted Apr 20, 2021·0 cites·15 claims
- 3055US2024083741A1Mems deviceROHM CO LTD·Filed 2023·Application pending·0 cites
- 3152US4349062AHighly durable pneumatic tire comprising bias laid carcass construction formed of superimposed stacked pliesBRIDGESTONE TIRE CO LTD·Filed 1980·Granted Sep 14, 1982·12 cites·6 claims
- 3250US11189459B2Multibeam inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2020·Granted Nov 30, 2021·0 cites·10 claims
- 3350USD310805SAutomobile tireBRIDGESTONE CORP·Filed 1987·Granted Sep 25, 1990·5 cites·1 claims
- 3450US2010329589A1Air-Cushioning Material and Bag For Transporting Packaging ObjectJAPAN NETWORK CO LTD·Filed 2008·Application pending·0 cites
- 3550US2016128456A1Brush manufacturing method and brushHASHIMOTO BRUSH FACTORY CO LTD·Filed 2014·Application pending·0 cites
- 3647US2007148759A1Biological sample discrimination device, biological sample discriminating method, and biological sample discriminating plateAMANO YOSHINORI·Filed 2004·Application pending·0 cites
- 3744US2008219676A1Transmitting device, receiving device, and optical communication methodTOSHIBA KK·Filed 2008·Application pending·0 cites
- 3843US2019346769A1Pattern inspection apparatus and pattern inspection methodNUFLARE TECHNOLOGY INC·Filed 2019·Application pending·0 cites
- 3942US4996605AMethod and apparatus for image scanning input for an image scanning recording apparatusDAINIPPON SCREEN MFG·Filed 1990·Granted Feb 26, 1991·8 cites·15 claims
- 4041US2006226029A1Measuring apparatus for ulcerative colitis diagnosis/prognostic test and method of measuringNISHIDA TAKESHI·Filed 2004·Application pending·0 cites
- 4141US2011256572A1Biological sample discrimination apparatus, biological sample discrimination method, and biological sample discrimination plateAMANO YOSHINORI·Filed 2011·Application pending·0 cites
- 4240US7522636B2System for controlling a plurality of equipmentsTOSHIBA KK·Filed 2004·Granted Apr 21, 2009·0 cites·18 claims
- 4340US2005222696A1Controller system and controller for mechatronics deviceTOSHIBA KK·Filed 2005·Application pending·0 cites
- 4439US2022185677A1Hafnium carbide powder for plasma electrodes, method for producing same, hafnium carbide sintered body, and plasma electrodeCHUBU ELECTRIC POWER·Filed 2019·Application pending·0 cites
- 4538US4340779AInterpreter intercommunication and public address systemPRINCE HOTELS INC·Filed 1980·Granted Jul 20, 1982·8 cites·1 claims
- 4629US6146514AApparatus and method for measuring acidityMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Nov 14, 2000·5 cites·27 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →