Inventor · disambiguated record
Hiroaki Hatanaka
Also filed as: HATANAKA HIROAKI
9 granted patents·2 pending applications·55 citations·filing 2002–2022
81Inventor score
Top patents by PatentIndex Score
11 records- 0184US6640632B1Ultrasonic flaw detection method and apparatusISHIKAWAJIMA HARIMA HEAVY IND·Filed 2002·Granted Nov 4, 2003·39 cites·4 claims
- 0278US8175820B2Defect inspection apparatus and defect inspection methodHATANAKA HIROAKI·Filed 2006·Granted May 8, 2012·14 cites·12 claims
- 0363US12105050B2Damage evaluation device and damage evaluation methodIHI CORP·Filed 2022·Granted Oct 1, 2024·0 cites·10 claims
- 0460US9612226B2Method for measuring height of lack of penetration and ultrasonic flaw detectorIHI INFRASTRUCTURE SYS CO LTD·Filed 2013·Granted Apr 4, 2017·1 cites·21 claims
- 0549US10656121B2Method for detecting arrangement disorder of fibers in conductive composite material, and device for detecting arrangement disorder of fibers in conductive composite materialIHI CORP·Filed 2016·Granted May 19, 2020·0 cites·9 claims
- 0647US2014354274A1Method and apparatus for eddy-current flaw detectionIHI CORP·Filed 2014·Application pending·0 cites
- 0744US7944203B2Corrosion evaluation device and corrosion evaluation methodIHI CORP·Filed 2006·Granted May 17, 2011·1 cites·9 claims
- 0842US10132778B2Fiber waviness detection method and apparatus for conductive composite materialsIHI CORP·Filed 2016·Granted Nov 20, 2018·0 cites·3 claims
- 0941US10605777B2Method for inspecting electroconductive composite material and device for inspecting electroconductive composite materialIHI CORP·Filed 2016·Granted Mar 31, 2020·0 cites·5 claims
- 1040US10877002B2Ultrasonic flaw detection device and ultrasonic flaw detection methodIHI CORP·Filed 2018·Granted Dec 29, 2020·0 cites·5 claims
- 1136US2015153313A1Interface inspection method and apparatus for composite structureIHI CORP·Filed 2015·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Hiroaki Hatanaka files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →