Inventor · disambiguated record
Hisayoshi Higashiguchi
Also filed as: HIGASHIGUCHI HISAYOSHI
2 granted patents·97 citations·filing 1996–1998
68Inventor score
Files withMITSUBISHI ELECTRIC CORP2
Top patents by PatentIndex Score
2 records- 0174US6327021B1Mask inspection system and method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Dec 4, 2001·56 cites·7 claims
- 0270US5767974AApparatus and method for identifying photomask pattern defectsMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jun 16, 1998·41 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →