Inventor · disambiguated record
Hideo Ishimori
Also filed as: ISHIMORI HIDEO
3 granted patents·2 pending applications·38 citations·filing 1999–2008
70Inventor score
Technology areasG01B
Top patents by PatentIndex Score
5 records- 0168US6353473B1Wafer thickness measuring apparatus and detection method thereofHITACHI ELECTR ENG·Filed 2000·Granted Mar 5, 2002·17 cites·18 claims
- 0244US6295131B1Interference detecting system for use in interferometerHITACHI ELECTR ENG·Filed 1999·Granted Sep 25, 2001·15 cites·7 claims
- 0334US2007201032A1Apparatus for inspecting a ball-bumped waferHITACHI HIGH TECH CORP·Filed 2007·Application pending·0 cites
- 0429US6628402B1Phase interference detecting method and system in interferometer, and light detector thereforHITACHI ELECTR ENG·Filed 1999·Granted Sep 30, 2003·6 cites·22 claims
- 0528US2008291468A1Apparatus and method for measuring height of protuberancesHITACHI HIGH TECH CORP·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →