Inventor · disambiguated record
Hiroyasu Itou
Also filed as: ITOU HIROYASU
11 granted patents·372 citations·filing 1994–2008
92Inventor score
Top patents by PatentIndex Score
11 records- 0193US5983059ARecyclable toner container for an image forming apparatusRICOH KK·Filed 1997·Granted Nov 9, 1999·66 cites·3 claims
- 0289US7235844B2Power composite integrated semiconductor device and manufacturing method thereofDENSO CORP·Filed 2005·Granted Jun 26, 2007·17 cites·55 claims
- 0389US5765087AColor image forming method and color image forming apparatus practicable therewithRICOH KK·Filed 1996·Granted Jun 9, 1998·51 cites·20 claims
- 0487US6150697ASemiconductor apparatus having high withstand voltageDENSO CORP·Filed 1999·Granted Nov 21, 2000·106 cites·21 claims
- 0586US6529788B1Recycling system and recycling methodRICOH KK·Filed 1999·Granted Mar 4, 2003·51 cites·49 claims
- 0679US7416932B2Power composite integrated semiconductor device and manufacturing method thereofDENSO CORP·Filed 2007·Granted Aug 26, 2008·7 cites·8 claims
- 0775US6914288B2EEPROM and EEPROM manufacturing methodDENSO CORP·Filed 2003·Granted Jul 5, 2005·22 cites·9 claims
- 0868US7691697B2Power composite integrated semiconductor device and manufacturing method thereofDENSO CORP·Filed 2008·Granted Apr 6, 2010·3 cites·36 claims
- 0962US6791156B2Semiconductor device and method for manufacturing itDENSO CORP·Filed 2002·Granted Sep 14, 2004·10 cites·31 claims
- 1051US5552342AMethod for producing a contact hole in a semiconductor device using reflow and etchNIPPON DENSO CO·Filed 1994·Granted Sep 3, 1996·28 cites·2 claims
- 1137US5677208AMethod for making FET having reduced oxidation inductive stacking faultNIPPON DENSO CO·Filed 1995·Granted Oct 14, 1997·11 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →