Inventor · disambiguated record
Hisataka Kanada
Also filed as: KANADA HISATAKA
8 granted patents·2 pending applications·55 citations·filing 2003–2011
84Inventor score
Top patents by PatentIndex Score
10 records- 0186US8536000B2Method for producing a semiconductor device have fin-shaped semiconductor regionsSASAKI YUICHIRO·Filed 2011·Granted Sep 17, 2013·8 cites·14 claims
- 0286US8004045B2Semiconductor device and method for producing the samePANASONIC CORP·Filed 2009·Granted Aug 23, 2011·11 cites·14 claims
- 0381US8063437B2Semiconductor device and method for producing the sameSASAKI YUICHIRO·Filed 2008·Granted Nov 22, 2011·8 cites·22 claims
- 0479US7192854B2Method of plasma dopingMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Mar 20, 2007·22 cites·11 claims
- 0566US7858479B2Method and apparatus of fabricating semiconductor devicePANASONIC CORP·Filed 2005·Granted Dec 28, 2010·2 cites·6 claims
- 0653US2008196834A1Liquid phase etching method and liquid phase etching apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2008·Application pending·0 cites
- 0748US7378031B2Liquid phase etching method and liquid phase etching apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted May 27, 2008·1 cites·9 claims
- 0844US7535220B2Beam measuring equipment and beam measuring method using the samePANASONIC CORP·Filed 2005·Granted May 19, 2009·0 cites·13 claims
- 0944US2012015504A1Semiconductor device and method for producing the sameSASAKI YUICHIRO·Filed 2011·Application pending·0 cites
- 1043US7888937B2Beam current sensorRIKEN·Filed 2004·Granted Feb 15, 2011·3 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →