Inventor · disambiguated record
Hironori Katsumi
Also filed as: KATSUMI HIRONORI
9 granted patents·11 pending applications·29 citations·filing 2008–2024
83Inventor score
Top patents by PatentIndex Score
20 records- 0186US11680951B2Sample analyzer and sample analyzing methodSYSMEX CORP·Filed 2019·Granted Jun 20, 2023·2 cites·20 claims
- 0285US8234941B2Specimen analyzing apparatus and specimen analyzing methodFUKUDA KAZUYA·Filed 2009·Granted Aug 7, 2012·11 cites·19 claims
- 0384US8580210B2Sample aspirating apparatus and sample analyzerKATSUMI HIRONORI·Filed 2011·Granted Nov 12, 2013·7 cites·20 claims
- 0483US10591500B2Sample analyzer, sample analyzing method, and reagent container holderSYSMEX CORP·Filed 2016·Granted Mar 17, 2020·2 cites·12 claims
- 0578US2024142482A1Specimen measurement apparatus and specimen transport deviceSYSMEX CORP·Filed 2023·Application pending·0 cites
- 0678US2024142483A1Specimen measurement apparatus and specimen transport deviceSYSMEX CORP·Filed 2023·Application pending·0 cites
- 0776US2023280363A1Sample analyzer and sample analyzing methodSYSMEX CORP·Filed 2023·Application pending·0 cites
- 0874US8999241B2Specimen analyzerKATSUMI HIRONORI·Filed 2012·Granted Apr 7, 2015·3 cites·17 claims
- 0971US8834791B2Sample analyzer and non-transitory storage mediumKATSUMI HIRONORI·Filed 2011·Granted Sep 16, 2014·4 cites·18 claims
- 1065US2024329065A1Specimen measurement apparatus and maintenance methodSYSMEX CORP·Filed 2024·Application pending·0 cites
- 1164US11796550B2Sample analyzer, sample analyzing method, and reagent container holderSYSMEX CORP·Filed 2020·Granted Oct 24, 2023·0 cites·18 claims
- 1261US2023204615A1Sample measuring method, cartridge, and sample measuring deviceSYSMEX CORP·Filed 2022·Application pending·0 cites
- 1359US2024329070A1Specimen measurement apparatus and specimen measurement methodSYSMEX CORP·Filed 2024·Application pending·0 cites
- 1453US9068956B2Specimen analyzing apparatus and specimen analyzing methodFUKUDA KAZUYA·Filed 2012·Granted Jun 30, 2015·0 cites·8 claims
- 1549US2008311678A1Sample analyzer and sample analyzing methodSYSMEX CORP·Filed 2008·Application pending·0 cites
- 1646US11846632B2Sample measurement device and sample measurement methodSYSMEX CORP·Filed 2018·Granted Dec 19, 2023·0 cites·16 claims
- 1746US2019201904A1Sample measuring apparatus and sample measuring methodSYSMEX CORP·Filed 2018·Application pending·0 cites
- 1845US2018259545A1Sample analyzerSYSMEX CORP·Filed 2018·Application pending·0 cites
- 1945US2018267069A1Sample analyzerSYSMEX CORP·Filed 2018·Application pending·0 cites
- 2039US2011223064A1Sample analyzerKATSUMI HIRONORI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →