Inventor · disambiguated record
Hirohiko Kitsuki
Also filed as: KITSUKI HIROHIKO
9 granted patents·2 pending applications·16 citations·filing 2006–2022
81Inventor score
Top patents by PatentIndex Score
11 records- 0189US7442929B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2006·Granted Oct 28, 2008·10 cites·20 claims
- 0280US11211226B2Pattern cross-sectional shape estimation system and programHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 28, 2021·1 cites·5 claims
- 0373US7807966B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 5, 2010·2 cites·2 claims
- 0471US9811897B2Defect observation method and defect observation deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 7, 2017·3 cites·12 claims
- 0557US8859962B2Charged-particle microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 14, 2014·0 cites·7 claims
- 0652US11557457B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted Jan 17, 2023·0 cites·11 claims
- 0752US2025285261A1Sample observation methodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0851US11195694B2Charged particle beam system, method for determining range for automatically searching for focal point position in charged particle beam device, and non-transitory storage medium recording program for causing computer system to determine range for automatically searching for focal position in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 7, 2021·0 cites·13 claims
- 0947US11164720B2Scanning electron microscope and calculation method for three-dimensional structure depthHITACHI HIGH TECH CORP·Filed 2020·Granted Nov 2, 2021·0 cites·15 claims
- 1046US8153970B2Scanning electron microscopeKITSUKI HIROHIKO·Filed 2010·Granted Apr 10, 2012·0 cites·4 claims
- 1143US2012119087A1Charged-particle microscopeTAKAHASHI NORITSUGU·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →