Inventor · disambiguated record
Hirokazu Kubo
Also filed as: KUBO HIROKAZU
19 granted patents·7 pending applications·95 citations·filing 1989–2024
92Inventor score
Top patents by PatentIndex Score
26 records- 0192US7551809B2Optical fiber delivery system for delivering ultrashort optical pulses and optical system including the sameOLYMPUS CORP·Filed 2008·Granted Jun 23, 2009·24 cites·14 claims
- 0276US7894131B2Laser microscopeOLYMPUS CORP·Filed 2008·Granted Feb 22, 2011·8 cites·15 claims
- 0374US10018822B2Laser microscope apparatus including photodetector having a plurality of detection elements and an adjusting mechanism for adjusting the beam diameterOLYMPUS CORP·Filed 2015·Granted Jul 10, 2018·1 cites·20 claims
- 0471US7196796B2Wavelength detecting apparatus, laser apparatus, and wavelength detecting methodGIGAPHOTON INC·Filed 2003·Granted Mar 27, 2007·10 cites·4 claims
- 0570US7995271B2Laser microscope with negative dispersion optical systemOLYMPUS CORP·Filed 2008·Granted Aug 9, 2011·5 cites·19 claims
- 0667US9356413B2Laser source apparatus and laser microscopeOLYMPUS CORP·Filed 2012·Granted May 31, 2016·2 cites·23 claims
- 0767US7329880B2Multiphoton-excitation laser scanning microscopeOLYMPUS CORP·Filed 2006·Granted Feb 12, 2008·5 cites·7 claims
- 0862US11900574B2Image processing system and image processing methodEVIDENT CORP·Filed 2022·Granted Feb 13, 2024·0 cites·20 claims
- 0960US8294985B2Laser microscope apparatusSASAKI HIROSHI·Filed 2009·Granted Oct 23, 2012·2 cites·8 claims
- 1060US2018188518A1Laser microscope apparatus including photodetector having a plurality of detection elementsOLYMPUS CORP·Filed 2018·Application pending·0 cites
- 1159US8159663B2Laser microscope apparatus having a frequency dispersion adjusterTAKIMOTO SHINICHI·Filed 2009·Granted Apr 17, 2012·1 cites·17 claims
- 1257US8279521B2Optical device and laser microscopeKUBO HIROKAZU·Filed 2008·Granted Oct 2, 2012·2 cites·9 claims
- 1357US2024395456A1METHOD FOR PRODUCING RFeB-BASED MAGNET, AND ALLOY FOR GRAIN BOUNDARY DIFFUSION PROCESS USED IN THE METHODDAIDO STEEL CO LTD·Filed 2024·Application pending·0 cites
- 1451US6243163B1Wavelength detectorKOMATSU MFG CO LTD·Filed 1999·Granted Jun 5, 2001·18 cites·14 claims
- 1551US4916283AWater cooling plasma arc working apparatusDAIHEN CORP·Filed 1989·Granted Apr 10, 1990·13 cites·5 claims
- 1648US10209504B2Light detecting device and laser microscope systemOLYMPUS CORP·Filed 2018·Granted Feb 19, 2019·0 cites·15 claims
- 1748US7869124B2Laser microscopeOLYMPUS CORP·Filed 2009·Granted Jan 11, 2011·0 cites·9 claims
- 1846US10379328B2Confocal scanner, confocal microscope, and illumination methodOLYMPUS CORP·Filed 2016·Granted Aug 13, 2019·0 cites·14 claims
- 1946US7121144B2Pressure sensor having a metal diaphragm responsive to pressureDENSO CORP·Filed 2004·Granted Oct 17, 2006·4 cites·9 claims
- 2045US10067329B2Microscope apparatus and specimen observation methodOLYMPUS CORP·Filed 2017·Granted Sep 4, 2018·0 cites·7 claims
- 2145US2016027564A1METHOD FOR PRODUCING RFeB SYSTEM SINTERED MAGNET AND RFeB SYSTEM SINTERED MAGNET PRODUCED BY THE SAMEINTERMETALLICS CO LTD·Filed 2014·Application pending·0 cites
- 2240US10001632B2Laser microscope apparatusOLYMPUS CORP·Filed 2016·Granted Jun 19, 2018·0 cites·22 claims
- 2340US2018113291A1Laser microscope and laser microscope systemOLYMPUS CORP·Filed 2017·Application pending·0 cites
- 2440US2011109961A1Pattern projection apparatus, scanning confocal microscope, and pattern radiating methodOLYMPUS CORP·Filed 2010·Application pending·0 cites
- 2537US2018012701A1METHOD FOR PRODUCING RFeB SYSTEM SINTERED MAGNETINTERMETALLICS CO LTD·Filed 2016·Application pending·0 cites
- 2632US2017278604A1RFeB SYSTEM SINTERED MAGNETINTERMETALLICS CO LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →