Inventor · disambiguated record
Hitoshi Kubota
Also filed as: KUBOTA HITOSHI
102 granted patents·11 pending applications·2,604 citations·filing 1976–2025
99Inventor score
Top patents by PatentIndex Score
113 records- 0199US6172363B1Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 1997·Granted Jan 9, 2001·185 cites·20 claims
- 0298US5893896AApparatus and method for stability controlling vehicular attitude using vehicular braking systemUNISIA JECS CORP·Filed 1997·Granted Apr 13, 1999·172 cites·21 claims
- 0398US5366914AVertical power MOSFET structure having reduced cell areaNEC CORP·Filed 1993·Granted Nov 22, 1994·278 cites·2 claims
- 0497US6329826B1Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2000·Granted Dec 11, 2001·95 cites·4 claims
- 0597US5774222AManufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspectedHITACHI LTD·Filed 1995·Granted Jun 30, 1998·167 cites·38 claims
- 0696US7417444B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2005·Granted Aug 26, 2008·25 cites·7 claims
- 0796US4717207ABooster unit for moving a vehicle on a slope and method of controlling the sameNISSAN MOTOR·Filed 1986·Granted Jan 5, 1988·85 cites·18 claims
- 0895US8680632B2Magnetoresistive element and magnetic memoryDAIBOU TADAOMI·Filed 2011·Granted Mar 25, 2014·25 cites·19 claims
- 0993US8107281B2Magnetoresistive element and magnetic memoryKAI TADASHI·Filed 2010·Granted Jan 31, 2012·23 cites·12 claims
- 1093US7556869B2Electronic device and wiring with a current induced cooling effect, and an electronic device capable of converting a temperature difference into voltageNAT INST OF ADVANCED IND SCIEN·Filed 2005·Granted Jul 7, 2009·28 cites·6 claims
- 1193US6404498B1Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspectedHITACHI LTD·Filed 2000·Granted Jun 11, 2002·38 cites·26 claims
- 1293US4355512AReservoir for use with tandem master cylinderNISSAN MOTOR·Filed 1980·Granted Oct 26, 1982·35 cites·4 claims
- 1390US7952074B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2008·Granted May 31, 2011·8 cites·18 claims
- 1490US5153444AMethod and apparatus for detecting patternsHITACHI LTD·Filed 1991·Granted Oct 6, 1992·92 cites·26 claims
- 1590US4633757ABrake boosterNISSAN MOTOR·Filed 1984·Granted Jan 6, 1987·29 cites·10 claims
- 1689US9087980B2Magnetoresistive element and magnetic memoryTOSHIBA KK·Filed 2014·Granted Jul 21, 2015·8 cites·19 claims
- 1789US8208292B2Magnetoresistive element and magnetic memoryKAI TADASHI·Filed 2012·Granted Jun 26, 2012·13 cites·15 claims
- 1889US6263099B1Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspectedHITACHI LTD·Filed 1998·Granted Jul 17, 2001·56 cites·28 claims
- 1989US4791586AMethod of and apparatus for checking geometry of multi-layer patterns for IC structuresHITACHI LTD·Filed 1985·Granted Dec 13, 1988·99 cites·30 claims
- 2088US9371427B2Pattern forming methodTOSHIBA KK·Filed 2015·Granted Jun 21, 2016·5 cites·20 claims
- 2188US5293538AMethod and apparatus for the inspection of defectsHITACHI LTD·Filed 1991·Granted Mar 8, 1994·80 cites·6 claims
- 2287US9219227B2Magnetoresistive element and magnetic memoryTOSHIBA KK·Filed 2014·Granted Dec 22, 2015·6 cites·20 claims
- 2387US6563682B1Magneto resistive elementSONY CORP·Filed 2000·Granted May 13, 2003·23 cites·14 claims
- 2487US5649022APattern checking method and checking apparatusHITACHI LTD·Filed 1992·Granted Jul 15, 1997·79 cites·43 claims
- 2587US5430548AMethod and apparatus for pattern detectionHITACHI LTD·Filed 1993·Granted Jul 4, 1995·70 cites·7 claims
- 2686US7599545B2Method and its apparatus for inspecting defectsHITACHI HIGH TECH CORP·Filed 2004·Granted Oct 6, 2009·27 cites·30 claims
- 2786US4725722AAutomatic focusing method and apparatus utilizing contrasts of projected patternHITACHI LTD·Filed 1986·Granted Feb 16, 1988·57 cites·12 claims
- 2885US6559663B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2001·Granted May 6, 2003·20 cites·10 claims
- 2985US5309108AMethod of inspecting thin film transistor liquid crystal substrate and apparatus thereforHITACHI LTD·Filed 1992·Granted May 3, 1994·89 cites·9 claims
- 3084US8013408B2Negative-resistance device with the use of magneto-resistive effectCANON ANELVA CORP·Filed 2009·Granted Sep 6, 2011·11 cites·9 claims
- 3184US7026830B2Method and apparatus for inspecting integrated circuit patternHITACHI LTD·Filed 2003·Granted Apr 11, 2006·19 cites·6 claims
- 3283US4500761AFluid reservoir with fluid-level sensorNISSAN MOTOR·Filed 1983·Granted Feb 19, 1985·25 cites·5 claims
- 3382US9415958B2Drawing apparatusKUBOTA HITOSHI·Filed 2012·Granted Aug 16, 2016·5 cites·18 claims
- 3482US9372445B2Image forming apparatusCANON KK·Filed 2014·Granted Jun 21, 2016·3 cites·17 claims
- 3582US8705269B2Magnetoresistive element and magnetic memoryNAGASE TOSHIHIKO·Filed 2011·Granted Apr 22, 2014·6 cites·18 claims
- 3682US4356729AFluid level detectorNISSAN MOTOR·Filed 1980·Granted Nov 2, 1982·24 cites·4 claims
- 3781US8502331B2Magnetoresistive effect element, magnetic memoryKITAGAWA EIJI·Filed 2011·Granted Aug 6, 2013·5 cites·14 claims
- 3880US7061600B2Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspectedRENESAS TECH CORP·Filed 2002·Granted Jun 13, 2006·11 cites·37 claims
- 3980US4385495AFluid reservoir for tandem master cylinderNISSAN MOTOR·Filed 1980·Granted May 31, 1983·20 cites·5 claims
- 4077US5229607ACombination apparatus having a scanning electron microscope thereinHITACHI LTD·Filed 1991·Granted Jul 20, 1993·47 cites·29 claims
- 4176US8521795B2Random number generating deviceFUKUSHIMA AKIO·Filed 2008·Granted Aug 27, 2013·8 cites·12 claims
- 4275US10423095B2Developing apparatus having a sealing sheet and unsealing mechanismCANON KK·Filed 2017·Granted Sep 24, 2019·1 cites·9 claims
- 4374US11022915B2Image forming apparatus with belt unit having cleaning unitCANON KK·Filed 2019·Granted Jun 1, 2021·1 cites·6 claims
- 4474US7460220B2Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspectedRENESAS TECH CORP·Filed 2006·Granted Dec 2, 2008·2 cites·11 claims
- 4574US6941200B2Automated guided vehicle, operation control system and method for the same, and automotive vehicleMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Sep 6, 2005·36 cites·20 claims
- 4674US4814615AMethod and apparatus for detecting defect in circuit pattern of a mask for X-ray exposureHITACHI LTD·Filed 1987·Granted Mar 21, 1989·31 cites·15 claims
- 4773US5280436AMethod for measuring three-dimensional position of object to be captured and method for capturing the objectMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1991·Granted Jan 18, 1994·40 cites·4 claims
- 4873US2025271811A1Image forming apparatus with a stopper member and an urging memberCANON KK·Filed 2025·Application pending·0 cites
- 4971US7180584B2Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspectedRENESAS TECH CORP·Filed 2003·Granted Feb 20, 2007·5 cites·25 claims
- 5070US4664016ASupply passage for brake booster of positive pressure typeJIDOSHA KIKI CO·Filed 1985·Granted May 12, 1987·15 cites·8 claims
Showing the top 50 of 113 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Hitoshi Kubota files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →