Inventor · disambiguated record
Hidehiko Kuroda
Also filed as: KURODA HIDEHIKO
33 granted patents·4 pending applications·425 citations·filing 1997–2020
97Inventor score
Top patents by PatentIndex Score
37 records- 0197US7728967B2Laser-based maintenance apparatusTOSHIBA KK·Filed 2006·Granted Jun 1, 2010·35 cites·9 claims
- 0295US8115936B2Laser ultrasonic detection device including a laser oscillating device which includes a seed laser oscillating elementOCHIAI MAKOTO·Filed 2010·Granted Feb 14, 2012·11 cites·7 claims
- 0394US8248595B2Laser-based maintenance apparatus for inspecting flaws based on a generated surface waveOCHIAI MAKOTO·Filed 2011·Granted Aug 21, 2012·9 cites·6 claims
- 0494US8094297B2Laser-based maintenance apparatus for inspecting flawsOCHIAI MAKOTO·Filed 2010·Granted Jan 10, 2012·10 cites·6 claims
- 0594US6998704B2Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatusNEC CORP·Filed 2003·Granted Feb 14, 2006·86 cites·56 claims
- 0693US8497986B2Laser-based maintenance apparatus using ultrasonic wave detection for flaw analysis and repairOCHIAI MAKOTO·Filed 2010·Granted Jul 30, 2013·7 cites·22 claims
- 0792US9557208B2Liquid level measuring apparatus, method, and programTOSHIBA KK·Filed 2012·Granted Jan 31, 2017·17 cites·7 claims
- 0886US5926062AReference voltage generating circuitNEC CORP·Filed 1998·Granted Jul 20, 1999·46 cites·8 claims
- 0982US5974860AOil detecting systemTOSHIBA KK·Filed 1997·Granted Nov 2, 1999·80 cites·27 claims
- 1081US9625273B2Thickness measurement apparatus and method thereofKURODA HIDEHIKO·Filed 2011·Granted Apr 18, 2017·5 cites·9 claims
- 1180US6460422B1Device for calculating a torque of a rotating memberTOSHIBA KK·Filed 2000·Granted Oct 8, 2002·29 cites·18 claims
- 1276US10102934B2Reactor state monitoring apparatus and monitoring method thereofTOSHIBA KK·Filed 2012·Granted Oct 16, 2018·2 cites·12 claims
- 1375US7888978B2Frequency synthesizerRENESAS ELECTRONICS CORP·Filed 2009·Granted Feb 15, 2011·8 cites·20 claims
- 1470US9523776B2Radiation detector and radiation detection methodTOSHIBA KK·Filed 2014·Granted Dec 20, 2016·3 cites·14 claims
- 1570US7104133B2Torsional vibration measuring instrumentTOSHIBA KK·Filed 2003·Granted Sep 12, 2006·14 cites·18 claims
- 1669US10175471B2Imaging device including a control unit configured to counteract vibrationNEC CORP·Filed 2016·Granted Jan 8, 2019·2 cites·4 claims
- 1769US6326842B1Variable gain amplifying apparatus which can change a gain during an operationNEC CORP·Filed 2000·Granted Dec 4, 2001·16 cites·25 claims
- 1865US8774340B2Nuclear reactor vibration surveillance system and its methodKURODA HIDEHIKO·Filed 2009·Granted Jul 8, 2014·1 cites·5 claims
- 1959US6509798B2Variable gain amplifierNEC COMPOUND SEMICONDUCTOR·Filed 2001·Granted Jan 21, 2003·6 cites·5 claims
- 2058US9279889B2Light detection unit and alpha ray observation deviceTOSHIBA KK·Filed 2014·Granted Mar 8, 2016·1 cites·9 claims
- 2156US11322982B2Coil member, contactless-type power transmission device, electromagnetic wave irradiation/reception device, power transmission/information communication device, and autonomous mobile robot systemJAPAN AVIATION ELECTRONICS IND LTD·Filed 2019·Granted May 3, 2022·0 cites·12 claims
- 2256US7671682B2Variable gain power amplifierNEC ELECTRONICS CORP·Filed 2006·Granted Mar 2, 2010·3 cites·6 claims
- 2349US7594644B2Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatusNEC CORP·Filed 2005·Granted Sep 29, 2009·0 cites·19 claims
- 2448US6008655AFrequency divider testing circuit clock-sampling window variable with divider outputNEC CORP·Filed 1997·Granted Dec 28, 1999·13 cites·5 claims
- 2547US5875042AImage scannerNEC CORP·Filed 1997·Granted Feb 23, 1999·12 cites·6 claims
- 2646US2010187108A1Gas-component measurement deviceMATSUMOTO TORU·Filed 2008·Application pending·0 cites
- 2745US12162140B2Wireless connector attachment/detachment method, robot device, and wireless connectorJAPAN AVIATION ELECTRONICS IND LTD·Filed 2020·Granted Dec 10, 2024·0 cites·13 claims
- 2845US6384668B2Charge pump circuitNEC CORP·Filed 2000·Granted May 7, 2002·4 cites·12 claims
- 2944US9927536B2Radiation detection apparatus and radiation detection methodTOSHIBA KK·Filed 2014·Granted Mar 27, 2018·0 cites·11 claims
- 3043US12212148B2Robot device and wireless connectorJAPAN AVIATION ELECTRONICS IND LTD·Filed 2020·Granted Jan 28, 2025·0 cites·31 claims
- 3142US9910163B2Alpha ray observation device and alpha ray observation methodTOSHIBA KK·Filed 2015·Granted Mar 6, 2018·0 cites·14 claims
- 3242US9099206B2Nuclear reactor vibration monitoring device and monitoring method thereofKURODA HIDEHIKO·Filed 2012·Granted Aug 4, 2015·0 cites·10 claims
- 3339US2011025360A1Semiconductor integrated circuit test deviceRENESAS ELECTRONICS CORP·Filed 2010·Application pending·0 cites
- 3439US2015369932A1Alpha ray observation apparatus, alpha ray observation system and alpha ray observation methodTOSHIBA KK·Filed 2014·Application pending·0 cites
- 3538US6087819ACurrent mirror circuit with minimized input to output current errorNEC CORP·Filed 1998·Granted Jul 11, 2000·5 cites·18 claims
- 3638US2018246478A1Isolation management system and isolation management methodTOSHIBA KK·Filed 2018·Application pending·0 cites
- 3735US9285264B2Vibration measuring apparatus for nuclear reactor internal structure and vibration measurement method thereforSATO KATSUHIKO·Filed 2011·Granted Mar 15, 2016·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →