Inventor · disambiguated record
Hiroko Miki
Also filed as: MIKI HIROKO
10 granted patents·19 pending applications·4 citations·filing 2011–2024
77Inventor score
Top patents by PatentIndex Score
29 records- 0170US2025093291A1Nucleic acid probe, chemical sensor, and detection methodTOSHIBA KK·Filed 2024·Application pending·0 cites
- 0268US8338911B2Semiconductor device and method of manufacturing the sameMIKI HIROKO·Filed 2011·Granted Dec 25, 2012·4 cites·20 claims
- 0364US12411133B2Chemical sensor device and method for manufacturing the sameTOSHIBA KK·Filed 2021·Granted Sep 9, 2025·0 cites·7 claims
- 0464US2024110229A1Chemical sensor using strand exchange reactionTOSHIBA KK·Filed 2023·Application pending·0 cites
- 0563US12306105B2Method for inspecting probe moleculeTOSHIBA KK·Filed 2023·Granted May 20, 2025·0 cites·12 claims
- 0659US2023194516A1Method for immobilizing nucleic acid compound, reagent kit, and sensorTOSHIBA KK·Filed 2022·Application pending·0 cites
- 0759US2023296576A1Chemical sensor device and method for detecting target substanceTOSHIBA KK·Filed 2022·Application pending·0 cites
- 0859US2023304964A1Fet sensor using antioxidantTOSHIBA KK·Filed 2022·Application pending·0 cites
- 0954US11635428B2Molecule detecting device and molecule detecting methodTOSHIBA KK·Filed 2020·Granted Apr 25, 2023·0 cites·7 claims
- 1049US10279348B2Semiconductor micro-analysis chip and method of manufacturing the sameTOSHIBA KK·Filed 2014·Granted May 7, 2019·0 cites·17 claims
- 1147US2014256031A1Semiconductor micro-analysis chip and sample liquid flowing methodTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1246US10533934B2Particle inspection system and driving method employed thereinTOSHIBA KK·Filed 2017·Granted Jan 14, 2020·0 cites·18 claims
- 1346US9895691B2Analysis package for detecting particles in a sample liquidTOSHIBA KK·Filed 2015·Granted Feb 20, 2018·0 cites·29 claims
- 1446US9770714B2Analysis package for detecting particles in a sample liquid, and including shield layersTOSHIBA KK·Filed 2015·Granted Sep 26, 2017·0 cites·16 claims
- 1544US10377650B2Membrane separation type activated sludge treatment method and systemSUMITOMO ELECTRIC INDUSTRIES·Filed 2016·Granted Aug 13, 2019·0 cites·6 claims
- 1644US9885680B2Analysis package for detecting particles in a sample liquid including an analysis chip mounted on a package boardTOSHIBA KK·Filed 2015·Granted Feb 6, 2018·0 cites·14 claims
- 1744US2019062818A1Sensor, reagent, method for manufacturing probe molecule, and method for manufacturing polymer moleculeTOSHIBA KK·Filed 2018·Application pending·0 cites
- 1844US2019064157A1Detection device, detection method, and electrode with probeTOSHIBA KK·Filed 2018·Application pending·0 cites
- 1943US2020094191A1Filtration apparatusSUMITOMO ELECTRIC INDUSTRIES·Filed 2017·Application pending·0 cites
- 2042US2021129083A1Filtration apparatusSUMITOMO ELECTRIC INDUSTRIES·Filed 2017·Application pending·0 cites
- 2140US2016320286A1Particle inspection unit and particle inspection systemTOSHIBA KK·Filed 2016·Application pending·0 cites
- 2239US2018078904A1Filtration apparatusSUMITOMO ELECTRIC INDUSTRIES·Filed 2016·Application pending·0 cites
- 2339US2018111097A1Method of operating filtration apparatus and filtration apparatusSUMITOMO ELECTRIC INDUSTRIES·Filed 2016·Application pending·0 cites
- 2439US2018369723A1Method for operating filtration apparatus and filtration apparatusSUMITOMO ELECTRIC INDUSTRIES·Filed 2017·Application pending·0 cites
- 2538US2019039025A1Filter unitSUMITOMO ELECTRIC INDUSTRIES·Filed 2016·Application pending·0 cites
- 2637US2018243698A1Filter unitSUMITOMO ELECTRIC INDUSTRIES·Filed 2016·Application pending·0 cites
- 2736US2018028981A1Filtration unitSUMITOMO ELECTRIC INDUSTRIES·Filed 2016·Application pending·0 cites
- 2836US2018111096A1Membrane separation type activated sludge treatment method and membrane separation type activated sludge treatment systemSUMITOMO ELECTRIC INDUSTRIES·Filed 2016·Application pending·0 cites
- 2934US2017120196A1Filtration apparatusSUMITOMO ELECTRIC INDUSTRIES·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →