Inventor · disambiguated record
Hiromi Mise
Also filed as: MISE HIROMI
8 granted patents·3 pending applications·4 citations·filing 2017–2022
74Inventor score
Files withHITACHI HIGH TECH CORP11
Top patents by PatentIndex Score
11 records- 0177US11268915B2Charged particle beam device, method for processing sample, and observation methodHITACHI HIGH TECH CORP·Filed 2018·Granted Mar 8, 2022·2 cites·13 claims
- 0265US11321585B2Imaging device and morphological feature data display methodHITACHI HIGH TECH CORP·Filed 2017·Granted May 3, 2022·2 cites·18 claims
- 0345US11791131B2Charged particle beam apparatus and method for controlling charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 17, 2023·0 cites·7 claims
- 0445US11742172B2Charged particle beam device and control method thereofHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 29, 2023·0 cites·15 claims
- 0544US2025253118A1Imaging System and Imaging MethodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0643US11756764B2Charged particle beam apparatus and method of controlling charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 12, 2023·0 cites·14 claims
- 0741US2024186108A1Charged Particle Beam SystemHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 0839US12131882B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 29, 2024·0 cites·6 claims
- 0937US12215308B2Charged particle beam apparatus and cell evaluation methodHITACHI HIGH TECH CORP·Filed 2017·Granted Feb 4, 2025·0 cites·5 claims
- 1037US12170184B2Transmission electron microscope and inspection method using transmission electron microscopeHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 17, 2024·0 cites·12 claims
- 1136US2023377836A1Analysis SystemHITACHI HIGH TECH CORP·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →