Inventor · disambiguated record
Hisaya Mori
Also filed as: MORI HISAYA
25 granted patents·1 pending application·603 citations·filing 1999–2023
97Inventor score
Top patents by PatentIndex Score
26 records- 0196US8979204B2Seat backboard and vehicle seatAWATA SHINJI·Filed 2011·Granted Mar 17, 2015·43 cites·10 claims
- 0296US7963595B2Vehicle seatsToyota Boshoku Kaisha·Filed 2009·Granted Jun 21, 2011·121 cites·10 claims
- 0396US7931330B2Air conditioning seatTOYOTA BOSHOKU KK·Filed 2008·Granted Apr 26, 2011·116 cites·4 claims
- 0492US9616791B2Seat configuration member and vehicle seat employing the seat configuration memberAWATA SHINJI·Filed 2011·Granted Apr 11, 2017·23 cites·11 claims
- 0592US7058865B2Apparatus for testing semiconductor integrated circuitRENESAS TECH CORP·Filed 2003·Granted Jun 6, 2006·60 cites·20 claims
- 0684US6642736B2Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuitsMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Nov 4, 2003·30 cites·18 claims
- 0783US6690189B2Apparatus and method for testing semiconductor integrated circuitRENESAS TECH CORP·Filed 2001·Granted Feb 10, 2004·32 cites·8 claims
- 0882US6934648B2Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signalRYODEN SEMICONDUCTOR SYST ENG·Filed 2003·Granted Aug 23, 2005·27 cites·8 claims
- 0978US6714888B2Apparatus for testing semiconductor integrated circuitRENESAS TECH CORP·Filed 2001·Granted Mar 30, 2004·23 cites·7 claims
- 1076US10279718B2Vehicle headrestTOYOTA BOSHOKU KK·Filed 2018·Granted May 7, 2019·3 cites·8 claims
- 1173US7079060B2Test circuit for evaluating characteristic of analog signal of deviceRENESAS TECH CORP·Filed 2005·Granted Jul 18, 2006·7 cites·9 claims
- 1273US6634004B1Threshold analysis system capable of deciding all threshold voltages included in memory device through single processingMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Oct 14, 2003·20 cites·16 claims
- 1371US6456102B1External test ancillary device to be used for testing semiconductor device, and method of testing semiconductor device using the deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 24, 2002·15 cites·11 claims
- 1470US6661248B2Tester for semiconductor integrated circuitsMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Dec 9, 2003·14 cites·17 claims
- 1568US9505329B2Vehicle seat and seat back boardMORI HISAYA·Filed 2011·Granted Nov 29, 2016·7 cites·10 claims
- 1668US6653855B2External test auxiliary device to be used for testing semiconductor deviceRENESAS TECH CORP·Filed 2001·Granted Nov 25, 2003·13 cites·4 claims
- 1762US9108552B2Vehicle seat and resin seatback springAWATA SHINJI·Filed 2011·Granted Aug 18, 2015·3 cites·14 claims
- 1862US6628137B2Apparatus and method for testing semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 30, 2003·10 cites·9 claims
- 1960US6651023B2Semiconductor test apparatus, and method of testing semiconductor deviceRENESAS TECH CORP·Filed 2001·Granted Nov 18, 2003·9 cites·11 claims
- 2058US9073467B2Vehicle seat and seat back boardAWATA SHINJI·Filed 2011·Granted Jul 7, 2015·3 cites·17 claims
- 2157US2024198911A1Vehicle interior structureTOYOTA MOTOR CO LTD·Filed 2023·Application pending·0 cites
- 2254US6900627B2Apparatus and method for testing semiconductor integrated circuitRENESAS SEMICONDUCTOR ENGINEER·Filed 2001·Granted May 31, 2005·8 cites·11 claims
- 2348US6587975B2Semiconductor test apparatus and methodMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jul 1, 2003·11 cites·13 claims
- 2444US10361746B2Semiconductor device and semiconductor systemRENESAS ELECTRONICS CORP·Filed 2018·Granted Jul 23, 2019·0 cites·16 claims
- 2543US6990614B1Data storage apparatus and data measuring apparatusRENESAS TECH CORP·Filed 2000·Granted Jan 24, 2006·5 cites·9 claims
- 2642US10486570B2Vehicle headrestTOYOTA BOSHOKU KK·Filed 2018·Granted Nov 26, 2019·0 cites·4 claims
Join the waitlist — get patent alerts
Get an alert when Hisaya Mori files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →