Inventor · disambiguated record
Hideyuki Moribe
Also filed as: MORIBE HIDEYUKI
8 granted patents·30 citations·filing 2001–2011
81Inventor score
Top patents by PatentIndex Score
8 records- 0187US7436507B2Method and apparatus for inspecting a patternNEC CORP·Filed 2007·Granted Oct 14, 2008·16 cites·19 claims
- 0271US7423745B2Optical inspection apparatus and optical inspection methodNEC CORP·Filed 2005·Granted Sep 9, 2008·5 cites·28 claims
- 0363US8614415B2Defect inspection method of fine structure object and defect inspection apparatusMORIBE HIDEYUKI·Filed 2008·Granted Dec 24, 2013·2 cites·19 claims
- 0455US6532248B2Diode-laser side-pumped solid-state laser deviceNEC CORP·Filed 2001·Granted Mar 11, 2003·6 cites·20 claims
- 0549US8009285B2Photomask mounting/housing device and resist inspection method and resist inspection apparatus using sameNEC CORP·Filed 2008·Granted Aug 30, 2011·1 cites·27 claims
- 0647US7773213B2Optical exterior inspection apparatus and methodNEC CORP·Filed 2009·Granted Aug 10, 2010·0 cites·6 claims
- 0741US8179523B2Photomask mounting/housing device and resist inspection method and resist inspection apparatus using sameKATOU YOSHIKAZU·Filed 2011·Granted May 15, 2012·0 cites·15 claims
- 0836US6664524B2Focusing methodNEC CORP·Filed 2001·Granted Dec 16, 2003·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →