Inventor · disambiguated record
Hiroyuki Morinaga
Also filed as: MORINAGA HIROYUKI
9 granted patents·2 pending applications·52 citations·filing 2002–2013
85Inventor score
Top patents by PatentIndex Score
11 records- 0185US7260443B2System and program for making recipe and method for manufacturing products by using recipeTOSHIBA KK·Filed 2005·Granted Aug 21, 2007·19 cites·20 claims
- 0278US7512501B2Defect inspecting apparatus for semiconductor waferTOSHIBA KK·Filed 2007·Granted Mar 31, 2009·7 cites·20 claims
- 0372US8392855B2Transferring pattern onto semiconductor substrate using optimum transfer condition determined for each divided areaMORINAGA HIROYUKI·Filed 2011·Granted Mar 5, 2013·4 cites·12 claims
- 0462US9165091B2Recipe management apparatus and recipe management methodTOSHIBA KK·Filed 2013·Granted Oct 20, 2015·2 cites·18 claims
- 0557US8364437B2Mark arrangement inspecting method, mask data, and manufacturing method of semiconductor deviceTOSHIBA KK·Filed 2009·Granted Jan 29, 2013·1 cites·19 claims
- 0657US6721935B2Coordinate transformation system for semiconductor device, coordinate transformation method and coordinate transformation programTOSHIBA KK·Filed 2002·Granted Apr 13, 2004·11 cites·27 claims
- 0753US7239934B2System and method for delivering writing data of a semiconductor device and fabricating a semiconductor deviceTOSHIBA KK·Filed 2004·Granted Jul 3, 2007·5 cites·19 claims
- 0847US7271808B2Image display control method and image display control apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Sep 18, 2007·3 cites·17 claims
- 0943US7847270B2Semiconductor manufacturing apparatus and method thereofTOSHIBA KK·Filed 2006·Granted Dec 7, 2010·0 cites·18 claims
- 1039US2007229482A1Image data display control deviceMORINAGA HIROYUKI·Filed 2007·Application pending·0 cites
- 1136US2006051687A1Inspection system and inspection method for pattern profileITO TAKEMA·Filed 2005·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Hiroyuki Morinaga files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →