Inventor · disambiguated record
Hiroshi Morioka
Also filed as: HIROI TAKASHI · MORIOKA HIROSHI · NOZOE MARI
40 granted patents·6 pending applications·1,408 citations·filing 1989–2024
98Inventor score
Files withHITACHI LTD16TOYOTA MOTOR CO LTD6FUJITSU LTD5FUJITSU MICROELECTRONICS LTD5FUJITSU SEMICONDUCTOR LTD2
Top patents by PatentIndex Score
46 records- 0198US6514175B2Hydraulic control system for transmissionsTOYOTA MOTOR CO LTD·Filed 2001·Granted Feb 4, 2003·133 cites·22 claims
- 0296US6388747B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2001·Granted May 14, 2002·62 cites·2 claims
- 0395US6759655B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2001·Granted Jul 6, 2004·74 cites·4 claims
- 0495US6421122B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2001·Granted Jul 16, 2002·51 cites·5 claims
- 0594US5274434AMethod and apparatus for inspecting foreign particles on real time basis in semiconductor mass production lineHITACHI LTD·Filed 1991·Granted Dec 28, 1993·218 cites·20 claims
- 0693US6583634B1Method of inspecting circuit pattern and inspecting instrumentHITACHI LTD·Filed 2000·Granted Jun 24, 2003·68 cites·5 claims
- 0793US5463459AMethod and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication processHITACHI LTD·Filed 1993·Granted Oct 31, 1995·145 cites·39 claims
- 0892US7601576B2Method for fabricating semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Oct 13, 2009·24 cites·18 claims
- 0991US7177020B2Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication processRENESAS TECH CORP·Filed 2005·Granted Feb 13, 2007·15 cites·19 claims
- 1091US6493082B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2002·Granted Dec 10, 2002·35 cites·4 claims
- 1190US6565465B2Continuously variable belt transmissionTOYOTA MOTOR CO LTD·Filed 2001·Granted May 20, 2003·42 cites·7 claims
- 1290US5233191AMethod and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production processHITACHI LTD·Filed 1991·Granted Aug 3, 1993·145 cites·14 claims
- 1389US6476913B1Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 1999·Granted Nov 5, 2002·59 cites·11 claims
- 1488US6703850B2Method of inspecting circuit pattern and inspecting instrumentHITACHI LTD·Filed 2003·Granted Mar 9, 2004·37 cites·6 claims
- 1588US6480279B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2001·Granted Nov 12, 2002·23 cites·2 claims
- 1688US6443871B2Control apparatus and method of belt-type continuously variable transmissionTOYOTA MOTOR CO LTD·Filed 2001·Granted Sep 3, 2002·31 cites·18 claims
- 1787US6919564B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2002·Granted Jul 19, 2005·23 cites·1 claims
- 1885US7116816B2Method of inspecting a pattern and an apparatus thereof and a method of processing a specimenHITACHI LTD·Filed 2001·Granted Oct 3, 2006·41 cites·23 claims
- 1982US6903821B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2002·Granted Jun 7, 2005·15 cites·6 claims
- 2080US4936730AElevated garageNISSEI BUILD KOGYO KK·Filed 1989·Granted Jun 26, 1990·44 cites·5 claims
- 2176US11507229B2Molded body for electronic function, method for manufacturing the same, and operation device using molded body for electronic functionPANASONIC IP MAN CO LTD·Filed 2020·Granted Nov 22, 2022·1 cites·17 claims
- 2272US7501686B2Semiconductor device and method for manufacturing the sameFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Mar 10, 2009·6 cites·19 claims
- 2371US6894773B2Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication processRENESAS TECH CORP·Filed 2001·Granted May 17, 2005·11 cites·27 claims
- 2470US7550394B2Semiconductor device and fabrication process thereofFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Jun 23, 2009·3 cites·15 claims
- 2570US6650409B1Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same systemHITACHI LTD·Filed 1996·Granted Nov 18, 2003·39 cites·49 claims
- 2670US6504609B2Inspection method, apparatus and system for circuit patternHITACHI LTD·Filed 2002·Granted Jan 7, 2003·7 cites·2 claims
- 2766US10962702B2Input devicePANASONIC IP MAN CO LTD·Filed 2019·Granted Mar 30, 2021·1 cites·14 claims
- 2865US6405115B2Shift control system for continuously variable transmissionsTOYOTA MOTOR CO LTD·Filed 2001·Granted Jun 11, 2002·10 cites·18 claims
- 2964US9224043B2Map generation apparatus, map generation method, moving method for moving body, and robot apparatusHASEGAWA OSAMU·Filed 2011·Granted Dec 29, 2015·4 cites·15 claims
- 3061US7455618B2Fluid level regulating method and fluid temperature regulator for automatic transmissionTOYOTA MOTOR CO LTD·Filed 2006·Granted Nov 25, 2008·3 cites·14 claims
- 3161US2024312608A1Medical Service Support Method, Recording Medium, and Medical Service Support SystemSHIMADZU CORP·Filed 2024·Application pending·0 cites
- 3261US2023415450A1Laminate, shaped article, molded article, method for manufacturing laminate, method for manufacturing shaped article, and method for manufacturing molded articlePANASONIC HOLDINGS CORP·Filed 2023·Application pending·0 cites
- 3359US7670759B2Micro pattern forming method and semiconductor device manufacturing methodFUJITSU MICROELECTRONICS LTD·Filed 2003·Granted Mar 2, 2010·5 cites·19 claims
- 3457US5118239ACubic parking apparatusNISSEI BUILD KOGYO KK·Filed 1990·Granted Jun 2, 1992·24 cites·9 claims
- 3553US9287168B2Semiconductor device and process for producing the sameFUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Mar 15, 2016·0 cites·3 claims
- 3652US6558463B2Solution and method for forming a ferroelectric filmNEC CORP·Filed 2000·Granted May 6, 2003·2 cites·9 claims
- 3748US7803518B2Method for manufacturing micro structureFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted Sep 28, 2010·0 cites·20 claims
- 3848US2009042402A1Method for fabricating semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2008·Application pending·0 cites
- 3947US6979610B2Semiconductor device fabrication methodFUJITSU LTD·Filed 2003·Granted Dec 27, 2005·2 cites·20 claims
- 4047US6449948B2Hydraulic circuit cleaning apparatus and methodTOYOTA MOTOR CO LTD·Filed 2001·Granted Sep 17, 2002·3 cites·10 claims
- 4145US6881653B2Method of manufacturing CMOS semiconductor deviceFUJITSU LTD·Filed 2003·Granted Apr 19, 2005·2 cites·19 claims
- 4243US8247290B2Semiconductor device and method of manufacturing thereofARIYOSHI JUNICHI·Filed 2008·Granted Aug 21, 2012·0 cites·7 claims
- 4343US2009032844A1Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2008·Application pending·0 cites
- 4442US2007037101A1Manufacture method for micro structureFUJITSU LTD·Filed 2005·Application pending·0 cites
- 4541US8749062B2Semiconductor device and process for producing the sameMORIOKA HIROSHI·Filed 2007·Granted Jun 10, 2014·0 cites·6 claims
- 4638US2005236667A1Manufacture of semiconductor device with selective amorphousizingFUJITSU LTD·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →