Inventor · disambiguated record
Hiroshi Muto
Also filed as: MUTO HIROSHI
26 granted patents·5 pending applications·633 citations·filing 1982–2023
97Inventor score
Top patents by PatentIndex Score
31 records- 0195US6429506B1Semiconductor device produced by dicingDENSO CORP·Filed 2000·Granted Aug 6, 2002·82 cites·1 claims
- 0294US6151966ASemiconductor dynamical quantity sensor device having electrodes in Rahmen structureDENSO CORP·Filed 1999·Granted Nov 28, 2000·111 cites·23 claims
- 0393US6287885B1Method for manufacturing semiconductor dynamic quantity sensorDENSO CORP·Filed 1999·Granted Sep 11, 2001·84 cites·38 claims
- 0490US9921002B2Radiator and electronic device having the sameFUJITSU LTD·Filed 2014·Granted Mar 20, 2018·10 cites·6 claims
- 0590US6245593B1Semiconductor device with flat protective adhesive sheet and method of manufacturing the sameDENSO CORP·Filed 1999·Granted Jun 12, 2001·99 cites·23 claims
- 0679US4448121ARotary printing press and inspection method and apparatus thereforKOMORI PRINTING MACH·Filed 1982·Granted May 15, 1984·22 cites·17 claims
- 0777US9406586B2Cooling jacket and electronic device having the sameSUZUKI MASUMI·Filed 2011·Granted Aug 2, 2016·4 cites·7 claims
- 0877US7214625B2Method for manufacturing movable portion of semiconductor deviceDENSO CORP·Filed 2004·Granted May 8, 2007·22 cites·56 claims
- 0977US6444543B2Semiconductor sensor device and method of manufacturing the sameDENSO CORP·Filed 2001·Granted Sep 3, 2002·23 cites·6 claims
- 1071US5248623AMethod for making a polycrystalline diode having high breakdownNIPPON DENSO CO·Filed 1991·Granted Sep 28, 1993·32 cites·8 claims
- 1167US7091109B2Semiconductor device and method for producing the same by dicingDENSO CORP·Filed 2004·Granted Aug 15, 2006·9 cites·11 claims
- 1265US6753201B2Method of manufacturing semiconductor device capable of sensing dynamic quantityDENSO CORP·Filed 2002·Granted Jun 22, 2004·11 cites·8 claims
- 1364US5872668AWaveshaping circuit for shaping an analog waveform having unequal positive and negative peak levels so that the positive and negative peak levels are equalFUJITSU LTD·Filed 1997·Granted Feb 16, 1999·15 cites·11 claims
- 1463US6787929B2Semiconductor device having a flat protective adhesive sheetDENSO CORP·Filed 2001·Granted Sep 7, 2004·7 cites·11 claims
- 1562US6130791AMagnetic disk drive having read channel in which low-frequency cutoff is set relatively high to cope with thermal asperityFUJITSU LTD·Filed 1997·Granted Oct 10, 2000·15 cites·5 claims
- 1660US6953753B2Method for manufacturing semiconductor deviceDENSO CORP·Filed 2003·Granted Oct 11, 2005·12 cites·10 claims
- 1760US5986831AWaveshaping circuit for shaping an analog waveform having unequal positive and negative peak levels so that the positive and negative peak levels are equalFUJITSU LTD·Filed 1996·Granted Nov 16, 1999·13 cites·18 claims
- 1858US2025207169A1METHOD FOR PRODUCING Fc-CONTAINING MOLECULEDAIICHI SANKYO CO LTD·Filed 2023·Application pending·0 cites
- 1956US6906394B2Method of manufacturing semiconductor device capable of sensing dynamic quantityDENSO CORP·Filed 2003·Granted Jun 14, 2005·6 cites·6 claims
- 2052US5136348AStructure and manufacturing method for thin-film semiconductor diode deviceNIPPON DENSO CO·Filed 1991·Granted Aug 4, 1992·14 cites·6 claims
- 2150US5168337APolycrystalline diode and a method for making the sameNIPPON DENSO CO·Filed 1992·Granted Dec 1, 1992·13 cites·6 claims
- 2246US5602503AZero level setting circuit for A/D converter in a magnetic disk driveFUJITSU LTD·Filed 1994·Granted Feb 11, 1997·5 cites·3 claims
- 2346US2011272128A1Radiator and electronic device having the sameFUJITSU LTD·Filed 2011·Application pending·0 cites
- 2445US6713403B2Method for manufacturing semiconductor deviceDENSO CORP·Filed 2003·Granted Mar 30, 2004·2 cites·1 claims
- 2545US5573982ASlurry composition, shaping method using the same, and fired bodyMITSUBISHI CHEMICAL BASF COMPA·Filed 1995·Granted Nov 12, 1996·11 cites·10 claims
- 2641US5731730AZero level setting circuit for A/D converter in a magnetic disk driveFUJITSU LTD·Filed 1996·Granted Mar 24, 1998·4 cites·4 claims
- 2740US5264720AHigh withstanding voltage transistorNIPPON DENSO CO·Filed 1992·Granted Nov 23, 1993·7 cites·9 claims
- 2840US2012055655A1Heat sink, liquid cooling unit, and electronic apparatusAOKI MICHIMASA·Filed 2011·Application pending·0 cites
- 2939US2012055654A1Radiator and electronic apparatus having coolant pathwayKATSUMATA KENJI·Filed 2011·Application pending·0 cites
- 3038US2012033382A1Heat sink, liquid cooling unit, and electronic apparatusTSUNODA YOSUKE·Filed 2011·Application pending·0 cites
- 3137US8176802B2Fibrous particle generating apparatus and test systemMUTO HIROSHI·Filed 2008·Granted May 15, 2012·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →