Inventor · disambiguated record
Hiroshi Nada
Also filed as: NADA HIROSHI
6 granted patents·2 pending applications·22 citations·filing 1992–2022
75Inventor score
Technology areasG01R
Top patents by PatentIndex Score
8 records- 0187US11619666B1Source measure apparatus including feedback path and measurement pathKEYSIGHT TECHNOLOGIES INC·Filed 2021·Granted Apr 4, 2023·2 cites·27 claims
- 0267US11674997B2Current supply device and test system including the sameKEYSIGHT TECHNOLOGIES INC·Filed 2022·Granted Jun 13, 2023·0 cites·8 claims
- 0360US9651596B2System and apparatus for measuring capacitanceKEYSIGHT TECHNOLOGIES INC·Filed 2013·Granted May 16, 2017·1 cites·5 claims
- 0459US11333701B2Current supply device and test system including the sameKEYSIGHT TECHNOLOGIES INC·Filed 2020·Granted May 17, 2022·0 cites·11 claims
- 0553US5285151AMethod and apparatus for measuring the breakdown voltage of semiconductor devicesHEWLETT PACKARD CO·Filed 1992·Granted Feb 8, 1994·17 cites·8 claims
- 0649US7812619B2Capacitance measuring apparatus and capacitance measuring methodAGILENT TECHNOLOGIES INC·Filed 2007·Granted Oct 12, 2010·2 cites·9 claims
- 0735US2006208754A1Method and apparatus for a reliability testingAGILENT TECHNOLOGIES INC·Filed 2005·Application pending·0 cites
- 0831US2009267634A1Switch Module for Semiconductor Characteristic Measurement and Measurement Method of Semiconductor CharacteristicsAGILENT TECHNOLOGIES INC·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →