Inventor · disambiguated record
Hiroshi Naiki
Also filed as: NAIKI HIROSHI
1 granted patent·4 pending applications·10 citations·filing 2004–2010
32Inventor score
Files withOLYMPUS CORP5
Top patents by PatentIndex Score
5 records- 0165US6954268B2Defect inspection apparatusOLYMPUS CORP·Filed 2004·Granted Oct 11, 2005·10 cites·7 claims
- 0239US2009097737A1Visual inspection apparatusOLYMPUS CORP·Filed 2008·Application pending·0 cites
- 0336US2006238753A1Visual inspection apparatusOLYMPUS CORP·Filed 2006·Application pending·0 cites
- 0431US2008144922A1Pattern alignment method, pattern inspection apparatus, and pattern inspection systemOLYMPUS CORP·Filed 2007·Application pending·0 cites
- 0527US2011169936A1MicroscopeOLYMPUS CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →