Inventor · disambiguated record
Hiroko Nakamura
Also filed as: NAKAMURA HIROKO
40 granted patents·11 pending applications·643 citations·filing 1988–2023
98Inventor score
Top patents by PatentIndex Score
51 records- 0196US5429730AMethod of repairing defect of structureTOSHIBA KK·Filed 1993·Granted Jul 4, 1995·114 cites·54 claims
- 0293US9709523B1Gas detection apparatusTOSHIBA KK·Filed 2016·Granted Jul 18, 2017·7 cites·9 claims
- 0392US6028953AMask defect repair system and method which controls a dose of a particle beamTOSHIBA KK·Filed 1998·Granted Feb 22, 2000·65 cites·7 claims
- 0488US5639699AFocused ion beam deposition using TMCTSTOSHIBA KK·Filed 1995·Granted Jun 17, 1997·62 cites·11 claims
- 0588US5591970ACharged beam apparatusTOSHIBA KK·Filed 1995·Granted Jan 7, 1997·56 cites·11 claims
- 0686US9177818B2Pattern formation method and block copolymerTOSHIBA KK·Filed 2013·Granted Nov 3, 2015·7 cites·19 claims
- 0785US8636914B2Method of forming patternNAKAMURA HIROKO·Filed 2012·Granted Jan 28, 2014·7 cites·9 claims
- 0885US5807650APhoto mask and apparatus for repairing photo maskTOSHIBA KK·Filed 1997·Granted Sep 15, 1998·57 cites·39 claims
- 0982US6265323B1Substrate processing method and apparatusTOSHIBA KK·Filed 1999·Granted Jul 24, 2001·54 cites·15 claims
- 1080US4942098ACorrosion resistant permanent magnetSUMITOMO SPEC METALS·Filed 1988·Granted Jul 17, 1990·24 cites·14 claims
- 1179US10761051B2Molecular detection apparatus and molecular detection methodTOSHIBA KK·Filed 2018·Granted Sep 1, 2020·1 cites·12 claims
- 1279US5799104AMask defect repair system and methodTOSHIBA KK·Filed 1996·Granted Aug 25, 1998·38 cites·13 claims
- 1377US9073284B2Method of forming pattern and laminateHIENO ATSUSHI·Filed 2012·Granted Jul 7, 2015·3 cites·19 claims
- 1475US7749687B2Pattern forming method used in semiconductor device manufacturing and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2007·Granted Jul 6, 2010·4 cites·20 claims
- 1575US7151953B2Communication apparatus having a light emitting unit that emits light in a variety of colorsSANYO TELECOMM CO LTD·Filed 2002·Granted Dec 19, 2006·17 cites·12 claims
- 1674US8986488B2Pattern formation method and polymer alloy base materialTOSHIBA KK·Filed 2013·Granted Mar 24, 2015·3 cites·13 claims
- 1773US7560197B2Mask pattern data producing method, patterning method, reticle correcting method, reticle manufacturing method, and semiconductor apparatus manufacturing methodTOSHIBA KK·Filed 2005·Granted Jul 14, 2009·3 cites·8 claims
- 1872US7319944B2Method for a predicting a pattern shape by using an actual measured dissolution rate of a photosensitive resistTOSHIBA KK·Filed 2004·Granted Jan 15, 2008·11 cites·31 claims
- 1969US7026099B2Pattern forming method and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2003·Granted Apr 11, 2006·12 cites·18 claims
- 2069US7009440B2Pulse signal generator and display deviceTEXAS INSTRUMENTS INC·Filed 2004·Granted Mar 7, 2006·11 cites·20 claims
- 2168US9017930B2Pattern formation method and guide pattern materialNAKAMURA HIROKO·Filed 2012·Granted Apr 28, 2015·2 cites·17 claims
- 2263US12347641B2Charged particle beam pattern forming device and charged particle beam apparatusTOSHIBA KK·Filed 2022·Granted Jul 1, 2025·0 cites·20 claims
- 2363US7816060B2Manufacturing method of semiconductor device, reticle correcting method, and reticle pattern data correcting methodTOSHIBA KK·Filed 2007·Granted Oct 19, 2010·1 cites·20 claims
- 2463US6632476B2Substrate processing method and substrate processing apparatusTOSHIBA KK·Filed 2001·Granted Oct 14, 2003·8 cites·23 claims
- 2563US4968529AProcess for producing a corrosion resistant permanent magnetSUMITOMO SPEC METALS·Filed 1989·Granted Nov 6, 1990·13 cites·23 claims
- 2661US9291908B2Method of forming pattern and laminateTOSHIBA KK·Filed 2015·Granted Mar 22, 2016·0 cites·16 claims
- 2761US7148138B2Method of forming contact hole and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2004·Granted Dec 12, 2006·9 cites·20 claims
- 2861US5623306ADark current suppression for solid state image sensing deviceFUJITSU LTD·Filed 1995·Granted Apr 22, 1997·29 cites·18 claims
- 2961US2021141310A1Photosensitive composition and method of manufacturing graphene deviceTOSHIBA KK·Filed 2021·Application pending·0 cites
- 3061US2024321545A1Semiconductor deviceTOSHIBA KK·Filed 2023·Application pending·0 cites
- 3157US2017248566A1Molecular detection apparatus and molecular detection methodTOSHIBA KK·Filed 2017·Application pending·0 cites
- 3256US10527581B2Molecular detection apparatus, molecular detection method, and organic probeTOSHIBA KK·Filed 2017·Granted Jan 7, 2020·0 cites·13 claims
- 3356US2017248565A1Molecular detection apparatus and molecular detection methodTOSHIBA KK·Filed 2016·Application pending·0 cites
- 3454US5549995APhotomask and method of manufacturing the sameTOSHIBA KK·Filed 1995·Granted Aug 27, 1996·15 cites·8 claims
- 3552US2019086804A1Photosensitive composition and method of manufacturing graphene deviceTOSHIBA KK·Filed 2018·Application pending·0 cites
- 3651US8182981B2Pattern forming methodNAKAMURA HIROKO·Filed 2009·Granted May 22, 2012·0 cites·19 claims
- 3750US7972932B2Mark forming method and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2009·Granted Jul 5, 2011·0 cites·17 claims
- 3850USD404065SAutomatic document feeder for a copying machineFUJI XEROX CO LTD·Filed 1997·Granted Jan 12, 1999·7 cites·1 claims
- 3949US10677770B2Molecular detection apparatus, molecular detection method, and molecular detectorTOSHIBA KK·Filed 2017·Granted Jun 9, 2020·0 cites·7 claims
- 4046US2008305443A1Pattern forming method using relacs processNAKAMURA HIROKO·Filed 2008·Application pending·0 cites
- 4146US2009011370A1Pattern forming method using two layers of resist patterns stacked one on top of the otherNAKAMURA HIROKO·Filed 2008·Application pending·0 cites
- 4245US8980748B2Substrate polishing method, semiconductor device and fabrication method thereforNAKAMURA HIROKO·Filed 2008·Granted Mar 17, 2015·0 cites·3 claims
- 4345US8101516B2Method of forming contact hole pattern in semiconductor integrated circuit deviceKOTANI TOSHIYA·Filed 2007·Granted Jan 24, 2012·0 cites·9 claims
- 4445US2019086327A1Molecular detection apparatus and method of detecting moleculesTOSHIBA KK·Filed 2018·Application pending·0 cites
- 4544US2019293596A1Gas sensing method, gas sensor, and gas sensing systemTOSHIBA KK·Filed 2018·Application pending·0 cites
- 4640US9207531B2Pattern forming methodNAKAMURA HIROKO·Filed 2011·Granted Dec 8, 2015·0 cites·24 claims
- 4740US2001014536A1Substrate processing method and apparatusTOSHIBA KK·Filed 2001·Application pending·0 cites
- 4836US2010317196A1Method for manufacturing semiconductor deviceNAKAMURA HIROKO·Filed 2010·Application pending·0 cites
- 4934US8808973B2Method of forming patternMIKOSHIBA SATOSHI·Filed 2012·Granted Aug 19, 2014·0 cites·6 claims
- 5033US5793856ASwitch system for switching extension numbersFUJITSU LTD·Filed 1996·Granted Aug 11, 1998·2 cites·3 claims
Showing the top 50 of 51 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →