Inventor · disambiguated record
Hiroyuki Nakano
Also filed as: NAKANO HIROYUKI
174 granted patents·44 pending applications·2,297 citations·filing 1984–2025
99Inventor score
Files withHITACHI LTD46DAIKIN IND LTD20HITACHI HIGH TECH CORP16JTEKT CORP16MURATA MANUFACTURING CO11
Top patents by PatentIndex Score
218 records- 0198US7636980B2Wiper blade having cover memberASMO CO LTD·Filed 2005·Granted Dec 29, 2009·53 cites·10 claims
- 0298US6876280B2High-frequency switch, and electronic device using the sameMURATA MANUFACTURING CO·Filed 2003·Granted Apr 5, 2005·129 cites·16 claims
- 0397US7528942B2Method and apparatus for detecting defectsHITACHI HIGH TECH CORP·Filed 2006·Granted May 5, 2009·32 cites·8 claims
- 0497US7465935B2Method for inspecting pattern defect and device for realizing the sameHITACHI HIGH TECH CORP·Filed 2006·Granted Dec 16, 2008·45 cites·8 claims
- 0597US7333192B2Apparatus and method for inspecting defectsHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 19, 2008·37 cites·20 claims
- 0695US7369223B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2005·Granted May 6, 2008·25 cites·5 claims
- 0795US5500756AOptical fiber transmission system and supervision method of the sameHITACHI LTD·Filed 1993·Granted Mar 19, 1996·183 cites·13 claims
- 0894US7603742B2Wiper blade and wiper system having the sameASMO CO LTD·Filed 2004·Granted Oct 20, 2009·54 cites·28 claims
- 0993US8980749B1Method for chemical mechanical polishing silicon wafersROHM & HAAS ELECT MAT·Filed 2013·Granted Mar 17, 2015·24 cites·10 claims
- 1093US7859656B2Defect inspection method and systemHITACHI HIGH TECH CORP·Filed 2009·Granted Dec 28, 2010·15 cites·18 claims
- 1193US7526832B2Wiper blade having a lever connected to wiper armASMO CO LTD·Filed 2004·Granted May 5, 2009·54 cites·16 claims
- 1293US7526200B2Wavelength-division multiplexing optical transmitterHITACHI COMM TECH LTD·Filed 2005·Granted Apr 28, 2009·21 cites·7 claims
- 1392US7363050B2Mobile station, base station, and wireless communication systemFUJITSU LTD·Filed 2005·Granted Apr 22, 2008·23 cites·4 claims
- 1491US7768635B2Apparatus and method for inspecting defectsHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 3, 2010·10 cites·20 claims
- 1591US7492452B2Defect inspection method and systemHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 17, 2009·13 cites·13 claims
- 1691US6545732B2Backlight assembly for liquid crystal display deviceADVANCED DISPLAY KK·Filed 2001·Granted Apr 8, 2003·49 cites·7 claims
- 1791US6403607B1Sulfonamide derivatives and drugs containing the same as the active ingredientHIDAKA HIROYOSHI·Filed 1999·Granted Jun 11, 2002·102 cites·8 claims
- 1890US8634069B2Defect inspection device and defect inspection methodNAKANO HIROYUKI·Filed 2009·Granted Jan 21, 2014·16 cites·15 claims
- 1990US8218138B2Apparatus and method for inspecting defectsNAKANO HIROYUKI·Filed 2011·Granted Jul 10, 2012·7 cites·11 claims
- 2090US5951903AMethod and apparatus for joining metal piecesKAWASAKI STEEL CO·Filed 1994·Granted Sep 14, 1999·20 cites·21 claims
- 2189USD524223SWiper bladeTOYOTA MOTOR CO LTD·Filed 2005·Granted Jul 4, 2006·49 cites·1 claims
- 2288US10625392B2Polishing padNITTA HAAS INC·Filed 2016·Granted Apr 21, 2020·3 cites·2 claims
- 2388US8616062B2Ultrasonic inspection system and ultrasonic inspection methodKONO NAOYUKI·Filed 2011·Granted Dec 31, 2013·13 cites·15 claims
- 2488US7426023B2Method and apparatus for detecting defectsHITACHI LTD·Filed 2005·Granted Sep 16, 2008·13 cites·15 claims
- 2588US6576559B2Semiconductor manufacturing methods, plasma processing methods and plasma processing apparatusesHITACHI LTD·Filed 2002·Granted Jun 10, 2003·32 cites·22 claims
- 2686US8107065B2Method and apparatus for detecting defectsNAKANO HIROYUKI·Filed 2010·Granted Jan 31, 2012·4 cites·8 claims
- 2786US5555477AOptical transmission system constructing method and systemHITACHI LTD·Filed 1993·Granted Sep 10, 1996·48 cites·5 claims
- 2885US7643139B2Method and apparatus for detecting defectsHITACHI HIGH TECH CORP·Filed 2005·Granted Jan 5, 2010·8 cites·6 claims
- 2985US6825437B2Apparatus enabling particle detection utilizing wide view lensHITACHI LTD·Filed 2002·Granted Nov 30, 2004·22 cites·31 claims
- 3085US5085184ADevice for reducing starting load on internal combustion engineHONDA MOTOR CO LTD·Filed 1990·Granted Feb 4, 1992·41 cites·7 claims
- 3184US9644942B2Method and apparatus for laser projection, and machining methodMITSUBISHI HITACHI POWER SYS·Filed 2013·Granted May 9, 2017·8 cites·4 claims
- 3282US4887052ATuned oscillator utilizing thin film ferromagnetic resonatorSONY CORP·Filed 1988·Granted Dec 12, 1989·47 cites·4 claims
- 3382US4649364ABifunctional environment sensorOMRON TATEISI ELECTRONICS CO·Filed 1984·Granted Mar 10, 1987·48 cites·11 claims
- 3481US8041213B2Optical transmission equipment and optical networkHITACHI LTD·Filed 2008·Granted Oct 18, 2011·7 cites·16 claims
- 3581US7973920B2Apparatus and method for inspecting defectsHITACHI HIGH TECH CORP·Filed 2010·Granted Jul 5, 2011·3 cites·19 claims
- 3680US10734619B2Battery device, battery unit, and method of installing battery deviceNGK INSULATORS LTD·Filed 2018·Granted Aug 4, 2020·1 cites·6 claims
- 3780US9782847B2Gear machining deviceJTEKT CORP·Filed 2015·Granted Oct 10, 2017·4 cites·12 claims
- 3880US7453561B2Method and apparatus for inspecting foreign particle defectsHITACHI HIGH TECH CORP·Filed 2006·Granted Nov 18, 2008·5 cites·7 claims
- 3980US6778272B2Method of processing a semiconductor deviceRENESAS TECH CORP·Filed 2001·Granted Aug 17, 2004·19 cites·20 claims
- 4080US6613588B2Floating particle inspection method and its apparatus and a semiconductor device processing apparatusHITACHI LTD·Filed 2001·Granted Sep 2, 2003·14 cites·12 claims
- 4180US6386949B1Method for cleansing/scraping and apparatus thereforSHIBUYA KOGYO CO LTD·Filed 2000·Granted May 14, 2002·24 cites·25 claims
- 4280US5831754AOptical amplifierHITACHI LTD·Filed 1995·Granted Nov 3, 1998·42 cites·18 claims
- 4379US8289507B2Method of apparatus for detecting particles on a specimenHAMAMATSU AKIRA·Filed 2011·Granted Oct 16, 2012·2 cites·12 claims
- 4479US7817261B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 19, 2010·4 cites·14 claims
- 4579US6248984B1Method and apparatus for joining metal piecesKAWASAKI STEEL CO·Filed 1999·Granted Jun 19, 2001·10 cites·2 claims
- 4678US12104862B2Heat exchanger and air-conditioning apparatusDAIKIN IND LTD·Filed 2024·Granted Oct 1, 2024·0 cites·10 claims
- 4778US7952700B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2010·Granted May 31, 2011·2 cites·12 claims
- 4878US7751037B2Method and apparatus for detecting defectsHITACHI HIGH TECH CORP·Filed 2009·Granted Jul 6, 2010·3 cites·7 claims
- 4978US7463829B2Optical transmission apparatus and control method thereforHITACHI COMM TECH LTD·Filed 2004·Granted Dec 9, 2008·15 cites·12 claims
- 5076US11652092B2Light-emitting device and capacitorMURATA MANUFACTURING CO·Filed 2020·Granted May 16, 2023·1 cites·19 claims
Showing the top 50 of 218 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →